Keyword: hardware
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WEOPMA05 Application of Industry Recognised Development Tools and Methodologies, such as Six Sigma to Facilitate the Efficient Delivery of Innovative and Robust Engineering Solutions at Synchrotron Facilities synchrotron, experiment, controls, factory 184
 
  • S. A. Macdonell
    DLS, Oxfordshire, United Kingdom
  
  Syn­chro­tron fa­cil­i­ties play a key part in the de­liv­ery of world lead­ing sci­ence to fa­cil­i­tate re­search and de­vel­op­ment across mul­ti­ple fields. The en­abling tech­nol­ogy de­signed by en­gi­neers at these fa­cil­i­ties is cru­cial to their suc­cess. The highly aca­d­e­mic na­ture of Syn­chro­tron fa­cil­i­ties does not al­ways lead to work­ing in the same way as a com­mer­cial en­gi­neer­ing com­pany. How­ever, are the en­gi­neer­ing re­quire­ments at Syn­chro­trons dif­fer­ent to com­mer­cial com­pa­nies? Ex­plor­ing the par­al­lels be­tween re­search and com­mer­cial com­pa­nies, can we show that the tools and method­olo­gies em­ployed could ben­e­fit en­gi­neer­ing de­vel­op­ment at Syn­chro­trons? This paper pro­vides a the­o­ret­i­cal dis­cus­sion on the com­mon­al­ity be­tween en­gi­neer­ing de­vel­op­ments at Syn­chro­tron fa­cil­i­ties com­pared to com­mer­cial com­pa­nies. How method­olo­gies such as De­sign for Six Sigma and in par­tic­u­lar tools such as stake­holder analy­sis, func­tional tree analy­sis, FMEA and DoE could be utilised in the de­sign process at Syn­chro­trons. It also seeks to demon­strate how im­ple­men­ta­tion could aid the de­vel­op­ment of in­no­v­a­tive, ro­bust and ef­fi­cient de­sign of en­gi­neer­ing so­lu­tions to meet the ever-in­creas­ing de­mands of our fa­cil­i­ties.  
slides icon Slides WEOPMA05 [1.633 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-MEDSI2018-WEOPMA05  
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WEPH06 Upgrade of Magnetic Measurements Laboratory at ALBA Synchrotron controls, software, TANGO, MMI 211
 
  • J. Campmany, F. Becheri, J. Marcos, V. Massana, R. Petrocelli, L. Ribó
    ALBA-CELLS Synchrotron, Cerdanyola del Vallès, Spain
  
  Along 2017 and 2018, a com­plete up­grade of ALBA mag­netic mea­sure­ments lab has been done. Up­grade has af­fected both hard­ware and soft­ware. Re­gard­ing hard­ware, a rel­e­vant in­no­va­tion has been the re­place­ment of DC mo­tors by step mo­tors in new Hall probe bench and in flip­ping and ro­tat­ing coil benches. Up to now, this kind of con­tin­u­ous mea­sure­ments usu­ally were done using DC mo­tors be­cause step mo­tors were con­sid­ered un­able to ful­fil the re­quired smooth­ness of the move­ment. How­ever, cur­rent step mo­tors state of the art made them com­pat­i­ble with DC. In our case, we have tested the per­for­mance of up­graded benches and they reach the same ac­cu­racy, or even bet­ter. Re­gard­ing soft­ware, we have uni­fied all mo­tion dri­vers to ICEPAP and all con­trol sys­tem to Tango pack­age, tak­ing ad­van­tage of the last ICEPAP firmware. That in­cludes the fea­ture of trig­ger­ing data ac­qui­si­tion sys­tem by sig­nals gen­er­ated from dif­fer­ent axis that can be se­lected by soft­ware.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-MEDSI2018-WEPH06  
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THPH07 Nanosurveyor 2: A Compact Instrument for Nano-Ptychography at the Advanced Light Source survey, MMI, electron, ISOL 352
 
  • R.S. Celestre, K. Nowrouzi, H.A. Padmore, D.A. Shapiro
    LBNL, Berkeley, California, USA
  • K. Nowrouzi
    UCB, Berkeley, California, USA
  
  Funding: This research used resources of the Advanced Light Source, which is a DOE Office of Science User Facility under contract no. DE-AC02-05CH11231.
The Ad­vanced Light Source has de­vel­oped a com­pact to­mo­graphic mi­cro­scope based on soft x-ray pty­chog­ra­phy for the study of meso and nanoscale ma­te­ri­als [1,2]. The mi­cro­scope uti­lizes the sam­ple ma­nip­u­la­tor mech­a­nism from a com­mer­cial TEM cou­pled with laser in­ter­fer­o­met­ric feed­back for zone plate po­si­tion­ing and a fast frame rate charge-cou­pled de­vice de­tec­tor for soft x-ray dif­frac­tion mea­sure­ments. The mi­cro­scope has achieved scan rates of greater than 50 Hz, in­clud­ing motor move, data read­out and x-ray ex­po­sure, with a po­si­tion­ing ac­cu­racy of bet­ter than 2 nm RMS and has achieved spa­tial res­o­lu­tion of bet­ter than 5 nm. The in­stru­ment en­ables the use of com­mer­cially avail­able sam­ple hold­ers com­pat­i­ble with FEI TEMs. This al­lows in-situ mea­sure­ment of sam­ples using both soft x-rays and elec­trons. This in­stru­ment is a re­fine­ment of a cur­rently com­mis­sioned in­stru­ment called The Nanosur­veyor, which has demon­strated res­o­lu­tion of bet­ter than 20nm in both two and three di­men­sions using 750 eV x-rays. [3] The in­stru­ment has been in­stalled on the new COS­MIC beam­line at the ALS. It will en­able spec­tro­mi­croscopy and to­mog­ra­phy of ma­te­ri­als with wave­length lim­ited spa­tial res­o­lu­tion.
[1] P. Thibault, et al, Science, 321, 379 (2008)
[2] P. Denes, et al, Rev. Sci. Inst., 80, 083302 (2009)
[3] D. Shapiro, et al, Nature Photonics volume 8, pages 765-769 (2014)
 		 
poster icon Poster THPH07 [1.422 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-MEDSI2018-THPH07  
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