ICALEPCS2017 - List of Keywords (optics)

Paper	Title	Other Keywords	Page
TUCPA05	Laser Damage Image Pre-processing Based on Total Variation	ion, laser, site, electron	272
	J. Luo, Z. Ni, X. Xie, X. Zhou CAEP, Sichuan, People's Republic of China
	The inspection and tracking of laser-induced damages of optics play a significant role in high-power laser systems. Laser-induced defects or flaws on the surfaces of optics are presented in images acquired by specific charge coupled devices (CCDs), hence the identification of defects from laser damage images is essential. Despite a great effort we have made to improve the imaging results, the defect identification is a challenging task. The proposed research focuses on the pre-processing of laser damage images, which assists identifying optic defects. We formulate the image pre-processing as a total variation (TV) based image reconstruction problem, and further develop an alternating direction method of multipliers (ADMM) algorithm to solve it. The use of TV regularization makes the pre-processed image sharper by preserving the edges or boundaries more accurately. Experimental results demonstrate the effectiveness of this method.
	Slides TUCPA05 [0.538 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-TUCPA05
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEBPL02	On-Axis 3D Microscope for X-Ray Beamlines at NSLS-II	ion, alignment, detector, EPICS	1048
	K.J. Gofron, Y.Q. Cai BNL, Upton, Long Island, New York, USA J. Wlodek Stony Brook University, Computer Science Department, Stony Brook, New York, USA
	Funding: Work supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract No. DE-SC0012704. A series of versatile on-axis X-ray microscopes with large working distances, high resolution and large magnification have been developed for in-situ sample alignment and X-ray beam visualization at beam-lines at NSLS-II [1]. The microscopes use reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.) [2]. Currently over seven reflective microscopes have been procured with several installed at NSLS2 beam-lines. Additional customizations can be implemented providing for example dual-view with high/low magnification, 3-D imaging, long working range, as well as ruby pressure system measurement. The microscope camera control frequently utilizes EPICS areaDetector. In specialized applications python programs integrate EPICS camera control, with computer vision, and EPICS motion control for goniostat centering or object detection applications. [1] K. J. Gofron, et. al.; AIP Conf. Proc. 1741, 030027-1-030027-4; doi: 10.1063/1.4952850. [2] K. J. Gofron, et. al., Nucl. Instr. and Meth. A 649, 109 (2011).
	Talk as video stream: https://youtu.be/O0zCZj624Mw
	Slides WEBPL02 [6.542 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-WEBPL02
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THPHA116	Emittance Measurement and Optics Matching at the European XFEL	ion, FEL, emittance, quadrupole	1655
	S.M. Meykopff, B. Beutner DESY, Hamburg, Germany
	Electron beam quality described by the emittance or phase space moments are important for the operation of FEL facilities like the European XFEL. For the operation these parameters need to be routinely measured. Based on such measurements machine setup can be optimized to match beam requirements. The beam parameters depend on parameters like quadrupole magnet strength or RF settings. While manual tuning is possible, we aim for highly automatized procedures to obtain such optimizations. In this paper we will present and discuss an overview of the different subsystems which are involved. These include image acquisition, analysis, and optics calculations as well as machine control user interfaces.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA116
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Other Keywords

Page

TUCPA05

Laser Damage Image Pre-processing Based on Total Variation

ion, laser, site, electron

272

J. Luo, Z. Ni, X. Xie, X. Zhou
CAEP, Sichuan, People's Republic of China

The inspection and tracking of laser-induced damages of optics play a significant role in high-power laser systems. Laser-induced defects or flaws on the surfaces of optics are presented in images acquired by specific charge coupled devices (CCDs), hence the identification of defects from laser damage images is essential. Despite a great effort we have made to improve the imaging results, the defect identification is a challenging task. The proposed research focuses on the pre-processing of laser damage images, which assists identifying optic defects. We formulate the image pre-processing as a total variation (TV) based image reconstruction problem, and further develop an alternating direction method of multipliers (ADMM) algorithm to solve it. The use of TV regularization makes the pre-processed image sharper by preserving the edges or boundaries more accurately. Experimental results demonstrate the effectiveness of this method.

Slides TUCPA05 [0.538 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-TUCPA05

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEBPL02

On-Axis 3D Microscope for X-Ray Beamlines at NSLS-II

ion, alignment, detector, EPICS

1048

K.J. Gofron, Y.Q. Cai
BNL, Upton, Long Island, New York, USA
J. Wlodek
Stony Brook University, Computer Science Department, Stony Brook, New York, USA

Funding: Work supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract No. DE-SC0012704.
A series of versatile on-axis X-ray microscopes with large working distances, high resolution and large magnification have been developed for in-situ sample alignment and X-ray beam visualization at beam-lines at NSLS-II [1]. The microscopes use reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.) [2]. Currently over seven reflective microscopes have been procured with several installed at NSLS2 beam-lines. Additional customizations can be implemented providing for example dual-view with high/low magnification, 3-D imaging, long working range, as well as ruby pressure system measurement. The microscope camera control frequently utilizes EPICS areaDetector. In specialized applications python programs integrate EPICS camera control, with computer vision, and EPICS motion control for goniostat centering or object detection applications.
[1] K. J. Gofron, et. al.; AIP Conf. Proc. 1741, 030027-1-030027-4; doi: 10.1063/1.4952850.
[2] K. J. Gofron, et. al., Nucl. Instr. and Meth. A 649, 109 (2011).

Talk as video stream: https://youtu.be/O0zCZj624Mw

Slides WEBPL02 [6.542 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-WEBPL02

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

THPHA116

Emittance Measurement and Optics Matching at the European XFEL

ion, FEL, emittance, quadrupole

1655

S.M. Meykopff, B. Beutner
DESY, Hamburg, Germany

Electron beam quality described by the emittance or phase space moments are important for the operation of FEL facilities like the European XFEL. For the operation these parameters need to be routinely measured. Based on such measurements machine setup can be optimized to match beam requirements. The beam parameters depend on parameters like quadrupole magnet strength or RF settings. While manual tuning is possible, we aim for highly automatized procedures to obtain such optimizations. In this paper we will present and discuss an overview of the different subsystems which are involved. These include image acquisition, analysis, and optics calculations as well as machine control user interfaces.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA116

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)