Keyword: emittance
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TUPHA065 Recent Enhancements to the Los Alamos Isotope Production Facility ion, controls, target, electron 548
 
  • M. Pieck, S.A. Baily, E. Espinoza, J.A. Faucett, J.O. Hill, F.M. Nortier, J.F. O'Hara, E.R. Olivas, A.R. Patten, L. Rybarcyk, J. F. Snyder, E.A. Swensen, R.A. Valicenti, H.A. Watkins, K.A. Woloshun
    LANL, Los Alamos, New Mexico, USA
 
  Funding: The work described was funded by the U.S. Department of Energy, Office of Science via the Isotope Development and Production for Research and Applications subprogram in the Office of Nuclear Physics.
Isotopes produced at Los Alamos National Laboratory (LANL) are saving lives, advancing cutting-edge research, and helping to address national security questions. For the past two years LANL's Accelerator Operations & Technology Division has executed a $6.4M improvement project for the Isotope Production Facility. The goals are to reduce the programmatic risk and enhance facility reliability while at the same time pursuing opportunities to increase general isotope production capacity. This has led to some exciting innovations. In this paper we will discuss the engineering designs for our new collimator, which is both adjustable and 'active' (i.e. equipped with beam current and temperature measurements), as well as our upgraded beam raster system and new beam diagnostics capabilities. We will also report on results obtained and lessons learned from the commissioning phase and initial production run.
LA-UR-17-22778
 
poster icon Poster TUPHA065 [0.755 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-TUPHA065  
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THMPA08 Processing of the Schottky Signals at RHIC ion, betatron, injection, cavity 1327
 
  • A. Sukhanov, K.A. Brown, C.W. Dawson, J.P. Jamilkowski, A. Marusic, J. Morris
    BNL, Upton, Long Island, New York, USA
 
  Funding: Work supported by Brookhaven Science Associates, LLC under Contract No. DE-SC0012704 with the U.S. Department of Energy.
Schottky monitors are used to determine important beam parameters in a non-destructive way. In this paper we present improved processing of the transverse and longitudinal Schottky signals from a hi-Q resonant 2.07 GHz cavity and transverse signals from a low-Q 245 MHz cavity with the main focus on providing the real-time measurement of beam tune, chromaticity and emittance during injection and ramp when the beam condition is changing rapidly. The analysis and control is done in python using recently developed interfaces to Accelerator Device Objects.
 
slides icon Slides THMPA08 [0.158 MB]  
poster icon Poster THMPA08 [0.726 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THMPA08  
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THPHA031 Fast Image Analysis for Beam Profile Measurement at the European XFEL ion, FEL, electron, ion-effects 1416
 
  • J. Wilgen, B. Beutner
    DESY, Hamburg, Germany
 
  At the European XFEL, images of scintillator screens are processed at a rate of 10 Hz. Dedicated image analysis servers are used for transversal beam profile analysis as well as for longitudinal profile and slice emittance measurement. This contribution describes the setup and the algorithms used for image analysis.  
poster icon Poster THPHA031 [1.161 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA031  
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THPHA116 Emittance Measurement and Optics Matching at the European XFEL ion, FEL, optics, quadrupole 1655
 
  • S.M. Meykopff, B. Beutner
    DESY, Hamburg, Germany
 
  Electron beam quality described by the emittance or phase space moments are important for the operation of FEL facilities like the European XFEL. For the operation these parameters need to be routinely measured. Based on such measurements machine setup can be optimized to match beam requirements. The beam parameters depend on parameters like quadrupole magnet strength or RF settings. While manual tuning is possible, we aim for highly automatized procedures to obtain such optimizations. In this paper we will present and discuss an overview of the different subsystems which are involved. These include image acquisition, analysis, and optics calculations as well as machine control user interfaces.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA116  
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