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RIS citation export for THPHA116: Emittance Measurement and Optics Matching at the European XFEL

TY - CONF
AU - Meykopff, S.M.
AU - Beutner, B.
ED - Schaa, Volker RW
ED - Costa, Isidre
ED - Fernández, David
ED - Matilla, Óscar
TI - Emittance Measurement and Optics Matching at the European XFEL
J2 - Proc. of ICALEPCS2017, Barcelona, Spain, 8-13 October 2017
C1 - Barcelona, Spain
T2 - International Conference on Accelerator and Large Experimental Control Systems
T3 - 16
LA - english
AB - Electron beam quality described by the emittance or phase space moments are important for the operation of FEL facilities like the European XFEL. For the operation these parameters need to be routinely measured. Based on such measurements machine setup can be optimized to match beam requirements. The beam parameters depend on parameters like quadrupole magnet strength or RF settings. While manual tuning is possible, we aim for highly automatized procedures to obtain such optimizations. In this paper we will present and discuss an overview of the different subsystems which are involved. These include image acquisition, analysis, and optics calculations as well as machine control user interfaces.
PB - JACoW
CP - Geneva, Switzerland
SP - 1655
EP - 1657
KW - ion
KW - FEL
KW - emittance
KW - optics
KW - quadrupole
DA - 2018/01
PY - 2018
SN - 978-3-95450-193-9
DO - 10.18429/JACoW-ICALEPCS2017-THPHA116
UR - http://jacow.org/icalepcs2017/papers/thpha116.pdf
ER -