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RIS citation export for THPHA031: Fast Image Analysis for Beam Profile Measurement at the European XFEL

TY - CONF
AU - Wilgen, J.
AU - Beutner, B.
ED - Schaa, Volker RW
ED - Costa, Isidre
ED - Fernández, David
ED - Matilla, Óscar
TI - Fast Image Analysis for Beam Profile Measurement at the European XFEL
J2 - Proc. of ICALEPCS2017, Barcelona, Spain, 8-13 October 2017
C1 - Barcelona, Spain
T2 - International Conference on Accelerator and Large Experimental Control Systems
T3 - 16
LA - english
AB - At the European XFEL, images of scintillator screens are processed at a rate of 10 Hz. Dedicated image analysis servers are used for transversal beam profile analysis as well as for longitudinal profile and slice emittance measurement. This contribution describes the setup and the algorithms used for image analysis.
PB - JACoW
CP - Geneva, Switzerland
SP - 1416
EP - 1419
KW - ion
KW - FEL
KW - emittance
KW - electron
KW - ion-effects
DA - 2018/01
PY - 2018
SN - 978-3-95450-193-9
DO - 10.18429/JACoW-ICALEPCS2017-THPHA031
UR - http://jacow.org/icalepcs2017/papers/thpha031.pdf
ER -