Paper | Title | Other Keywords | Page | ||
---|---|---|---|---|---|
MOO1A03 | Review of Synchrotron Radiation based Diagnostics for Transverse Profile Measurements | emittance, radiation, synchrotron, diagnostics | 6 | ||
|
The transverse particle beam emittance is a crucial accelerator parameter because it is directly related to the brilliance of a synchrotron light source or the luminosity of a particle beam collider. Therefore a precise online control of the beam profile is highly desirable from which the corresponding emittance can be calculated. In addition observation of the particle beam shape's time-like evolution allows to study effects as for example injection mismatch and dynamical beta beating which are important for smooth-running accelerator operation. Due to its non-destructive nature synchrotron radiation is a versatile tool for beam profile measurements and is used in nearly every accelerator. While in principle synchrotron radiation from insertion devices or bending magnets can be utilized, in reality most accelerators use bending magnet radiation based profile monitoring because of space limitations. There exist a number of different techniques in order to overcome limitations due to resolution broadening effects which can result in theoretical resolutions down to the sub-micron level. In this talk an overview over the methods presently applied in most accelerators will be given.
|
|
|
||
TUPB27 | Recent Results from the Electron Beam Profile Monitor at the Swiss Light Source | electron, synchrotron, emittance, synchrotron-radiation | 129 | ||
|
Two different methods of beam profile measurements using a) visible-to-UV range synchrotron radiation and b) X-ray synchrotron radiation have been realized in a single diagnostics beam line at the Swiss Light Source (SLS). In the visible-to-UV case the vertically polarized synchrotron radiation renders an image heavily influenced by inherent emission and diffraction effects of synchrotron radiation. This nevertheless turns out to be an advantageous influence when determining rms beam profiles below 10 μm. However, high-precision wave-optics based calculations of the synchrotron light characteristics need to be performed (SRW-code) to ensure correct interpretation of the measured profiles. The visible-to-UV branch has a few built-in features allowing numerous cross-checks of the SRW-model. Surprisingly, wave-optics based calculations are also applicable, and required, for the X-ray pinhole camera setup. We briefly discuss the advantage of applying two different measuring techniques at the same source point. In total, for standard user operation at the SLS, the beam line has helped to establish a vertical emittance below 10 pmrad.
|
|
|
||
TUPC10 | A transverse RF deflecting cavity for the FERMI@elettra project | emittance, electron, linac, diagnostics | 168 | ||
|
The layout of FERMI@elettra includes a high energy transfer line (TL) which brings the accelerated electron bunch to the FEL undulator chains. The TL optics has been designed according to several space constraints and with the purpose of including diagnostics for the complete characterization of the electron bunch just before the FEL process starts. Basing on such optics, this paper reports the study of the electron bunch deflection at nominal energy of 1.2 GeV for the measurement of the bunch length, of the transverse slice emittance and of the slice energy spread, coupled to a downstream dipole. The effect of the cavity on the electron beam was simulated by tracking code and the specification on the deflecting voltage was thus confirmed. Furthermore the RF design and electromagnetic simulations are also presented here.
|
|
|
||
WEO1A02 | Progress in Ultrafast X-ray Streak Cameras | electromagnetic-fields, gun | 209 | ||
|
Streak cameras remain one of the tools for study of ultrafast phenomena. We present progress on modeling of x-ray streak cameras with application to measurement of ultrafast phenomena. Our approach is based on treating the streak camera as a photocathode gun and applying modeling tools for beam optics and electromagnetic fields. We use these models to compare with experimental results from a streak camera developed at the Advanced Light Source. We also show how this model can be used to explore several ideas for achieving sub-100 fsec resolution.
|
|
|
||
WEPB01 | Design of an Electron Beam Energy Control Loop Using Transverse Dispersion | controls, dipole, electron, target | 229 | ||
|
Stability in mean electron beam energy is of highest interest for a number of experiments performed at the ELBE accelerator. Energy drifts affect parameters of the generated Bremsstrahlung spectra, X-rays or infrared light, as well as the beam trajectory at the production targets or through the FEL waveguide, respectively. In practise, we observe a slow drifting of the effective accelerating field during the first hours after a machine power-up or after switching to different nominal beam energies. Initially, this effect was compensated manually. A first order automation solution has been developed that corrects the resulting energy drift continuously, using a non-intrusive beam position monitor placed in a transversely dispersive part of the beam guide. This paper describes the beam line setup and the simplified dynamic model of the control loop derived from it. Calculation of controller parameters using standard a standard method is shown. The user interface of the control system and working conditions for the loop are explained. Operational performance and conclusions towards improvements close this contribution.
|
|
|
||
WEPB08 | Noise and drift characterization of critical components for the laser based synchronization system at FLASH | laser, extraction, free-electron-laser, radiation | 250 | ||
|
At FLASH, a new synchronization system based on distributing streams of short laser pulses through optical fibers will be installed and commissioned in 2007. At several end stations, a low drift- and low noise conversion of the optical signal into RF signals is needed. In this paper, we present the influence of photodiodes on the phase stability of the optical pulse streams and investigate the drift performance of the photo-detection scheme for the extraction of the RF signal.
|
|
|
||
WEPB12 | Measurement of Bunch Lengthening Effects Using a Streak Camera with Reflective Optics | impedance, vacuum, synchrotron, coupling | 256 | ||
|
For the precise measurement of the bunch length, the incident optics of a streak camera must be free from an optical path difference due to chromatic effects. We designed and installed a reflective optics for the streak camera, and measured the bunch length as a function of the beam current. In the KEK Photon Factory, almost one half of the vacuum components were replaced in 2005. We measured the bunch lengthening effects before and after the replacement. The threshold-current of the microwave instabilities showed the impedance of the storage ring was greatly improved. This paper describes the detail of measurement and the calculations of the impedance of vacuum components.
|
|
|
||
WEPB18 | Electron Beam Temperature Measurements at the Fermilab Medium Energy Electron Cooler | electron, radiation, antiproton, diagnostics | 268 | ||
|
The Fermilab Recycler ring employs an electron cooler to store and cool 8.9-GeV antiprotons. The cooler is based on an electrostatic accelerator (Pelletron) working in an energy-recovery regime. Several techniques for determining the characteristics of the beam dynamics have been investigated. Beam temperature measurements using OTR in conjunction with a Pepper-pot have been made at several settings of the upstream optics of the machine. Without temperature the pepper-pot hole images would have sharp boundaries. A finite temperature makes these boundaries broader. Thus, comparison of the ratios of the hole image boundaries and intensities is a measure of the beam temperature. In this paper we report the results so far obtained using this technique.
|
|
|
||
WEPB20 | Optical System for Measuring Electron Bunch Length and Longitudinal Phase Space at Pitz: Extension and Methodical Investigations | electron, booster, gun, photon | 274 | ||
|
An extended optical system* for the measurement of the electron bunch length and the longitudinal phase space** using a streak camera is installed at PITZ. This system will be extended by two new branches in 2007, one in the straight section behind the booster cavity and another one in the first magnet spectrometer behind the booster cavity. The physics design of the chambers containing the radiators and of the optical system are presented. The results of optical calculations of the whole system will be given. Results of methodical investigations will be shown as well, especially concerning transversal optical resolution and time dispersion.
|
* J. Baehr et al., DIPAC 03, Mainz, Germany 2003** J. Roensch et al. FEL 05, SLAC, Stanford, USA, 2005 |
|