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synchrotron-radiation

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TUPB27 Recent Results from the Electron Beam Profile Monitor at the Swiss Light Source electron, synchrotron, emittance, optics 129
 
  • Å. Andersson
    MAX-lab, Lund
  • O. V. Chubar
    SOLEIL, Gif-sur-Yvette
  • A. Lüdeke, M. Rohrer, V. Schlott, A. Streun
    PSI, Villigen
  Two different methods of beam profile measurements using a) visible-to-UV range synchrotron radiation and b) X-ray synchrotron radiation have been realized in a single diagnostics beam line at the Swiss Light Source (SLS). In the visible-to-UV case the vertically polarized synchrotron radiation renders an image heavily influenced by inherent emission and diffraction effects of synchrotron radiation. This nevertheless turns out to be an advantageous influence when determining rms beam profiles below 10 μm. However, high-precision wave-optics based calculations of the synchrotron light characteristics need to be performed (SRW-code) to ensure correct interpretation of the measured profiles. The visible-to-UV branch has a few built-in features allowing numerous cross-checks of the SRW-model. Surprisingly, wave-optics based calculations are also applicable, and required, for the X-ray pinhole camera setup. We briefly discuss the advantage of applying two different measuring techniques at the same source point. In total, for standard user operation at the SLS, the beam line has helped to establish a vertical emittance below 10 pmrad.  
 
TUPC03 Synchrotron Radiation Monitor for Energy Spectrum Measurements in the Bunch Compressor at FLASH electron, dipole, acceleration, synchrotron 150
 
  • C. Gerth
    DESY, Hamburg
  Longitudinal bunch compression in magnetic chicanes is used at the Free-electron LASer in Hamburg FLASH for the generation of ultra-short electron bunches. A Synchrotron Radiation (SR) monitor has been installed behind the third dipole of the first bunch compressor to measure the energy and energy profile of the dispersed bunches. An intensified CCD camera records the emitted SR in the visible and enables one to select single bunches out of a bunch train. The performance of the system has been tested for different accelerator settings. The setup serves as a test bed for the European XFEL.  
 
TUPC16 Ultimate Resolution of Soleil X-Ray Pinhole Camera photon, radiation, coupling, synchrotron 180
 
  • M.-A. Tordeux, L. Cassinari, O. V. Chubar, J.-C. Denard, D. Pédeau, B. Pottin
    SOLEIL, Gif-sur-Yvette
  During the commissioning of the SOLEIL Storage Ring, beam emittances have been measured with an X-ray pinhole camera system. The evolution of the system and its performances are presented here. As a result of the excellent alignment of the ring magnets, the vertical beam size is smaller than expected, that led us to an effort towards improving the initial resolution of the instrument. A high sensitivity CCD camera allows us to select the harder X-ray part of the radiation which is a key element for resolution improvement. Finally an evaluation of the ultimate pinhole resolution is made for SOLEIL.  
 
WEPC08 Fiberoptics-Based Instrumentation for Storage Ring Beam Diagnostics coupling, synchrotron, diagnostics, photon 325
 
  • S. De Santis, J. M. Byrd
    LBNL, Berkeley, California
  • Y. Yin
    Y. Y. Labs, Inc., Fremont, California
  We present the results of our experiments at the Advanced Light Source concerning the coupling of synchrotron radiation into optical fibers. Many beam diagnostic devices in today's synchrotron rings make use of the radiation emitted by the circulating particles. Such instruments are placed in close proximity of the accelerator, where in many instances they cannot be easily accessed for safety consideration, or at the end of a beamline, which, because of its cost, can only move the light port a few meters away from the ring. Our method, suitable for all those applications where the longitudinal properties of the beam are measured (i.e. bunch length, phase, etc.), allows placing the diagnostic instruments wherever is more convenient, up to several hundreds of meters away from the tunnel. This would make maintaining and replacing instruments, or switching between them, possible without any access to restricted areas. Additionally, one can use the vast array of optoelectronic devices, developed by the telecommunication industry, for signal analysis.