Paper | Title | Page |
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THOPMA06 | Development of Low Vibration Cooling Systems for Beamline Optics Using Heat Pipe Technology | 331 |
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Funding: This research used resources of the Advanced Light Source, which is a DOE Office of Science User Facility under contract no. DE-AC02-05CH11231. Cooling of in-vacuum beamline components has always been problematic. Water cooling lines can transfer vibrations to critical components, and often require complex air guarding systems to ensure that the vacuum envelope is not breached in the event of a leak. These constraints increase design complexity, limit options, and provide challenges for assembly and maintenance. Commercial heat pipes are inexpensive and readily available. Custom assemblies can be fabricated into vacuum flanges and may use non-water based cooling mediums if required. A mockup of an optical assembly has been used to explore vibration reduction and cooling capacity. Other example beamline components such as a heat generating electromagnetic shutter demonstrate the cooling capability of these heat pipes. |
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Slides THOPMA06 [13.432 MB] | |
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-MEDSI2018-THOPMA06 | |
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THPH07 | Nanosurveyor 2: A Compact Instrument for Nano-Ptychography at the Advanced Light Source | 352 |
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Funding: This research used resources of the Advanced Light Source, which is a DOE Office of Science User Facility under contract no. DE-AC02-05CH11231. The Advanced Light Source has developed a compact tomographic microscope based on soft x-ray ptychography for the study of meso and nanoscale materials [1,2]. The microscope utilizes the sample manipulator mechanism from a commercial TEM coupled with laser interferometric feedback for zone plate positioning and a fast frame rate charge-coupled device detector for soft x-ray diffraction measurements. The microscope has achieved scan rates of greater than 50 Hz, including motor move, data readout and x-ray exposure, with a positioning accuracy of better than 2 nm RMS and has achieved spatial resolution of better than 5 nm. The instrument enables the use of commercially available sample holders compatible with FEI TEMs. This allows in-situ measurement of samples using both soft x-rays and electrons. This instrument is a refinement of a currently commissioned instrument called The Nanosurveyor, which has demonstrated resolution of better than 20nm in both two and three dimensions using 750 eV x-rays. [3] The instrument has been installed on the new COSMIC beamline at the ALS. It will enable spectromicroscopy and tomography of materials with wavelength limited spatial resolution. [1] P. Thibault, et al, Science, 321, 379 (2008) [2] P. Denes, et al, Rev. Sci. Inst., 80, 083302 (2009) [3] D. Shapiro, et al, Nature Photonics volume 8, pages 765-769 (2014) |
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Poster THPH07 [1.422 MB] | |
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-MEDSI2018-THPH07 | |
Export • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |