IBIC2017 - List of Authors (Hiller, N.)

Paper	Title	Page
MOPWC03	Commissioning Results and First Operational Experience with SwissFEL Diagnostics	104
	V. Schlott, V.R. Arsov, M. Baldinger, R. Baldinger, G. Bonderer, S. Borrelli, R. Ditter, D. Engeler, F. Frei, N. Hiller, R. Ischebeck, B. Keil, W. Koprek, R. Kramert, D. Llorente Sancho, A. Malatesta, F. Marcellini, G. Marinkovic, G.L. Orlandi, C. Ozkan Loch, P. Pollet, M. Roggli, M. Rohrer, M. Stadler, D.M. Treyer PSI, Villigen PSI, Switzerland
	SwissFEL is a free electron laser user facility at the Paul Scherrer Institute in Villigen, Switzerland designed to provide FEL radiation at photon energies ranging from 0.2 to 12 keV. Beam commissioning of the hard x-ray line ARAMIS has started in October 2016 and lasing at 300 eV was achieved in May 2017. First pilot user experiments at photon energies ≥ 2 keV are foreseen for the end of 2017. This contribution comprehends commissioning results and first operational experience of various diagnostics systems, such as beam position monitors, charge and loss monitors as well as transverse profile measurements with screens, wire scanners and synchrotron radiation monitors. It also provides information about sliced beam parameters using a transverse deflector and shows first results from the BC-1 compression monitor and measurements with the electron bunch arrival time monitors.
	Poster MOPWC03 [1.088 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-MOPWC03
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TU1AB2	High Repetition-Rate Electro-optic Sampling: Recent Studies Using Photonic Time-Stretch	121
	S. Bielawski, M. Le Parquier PhLAM/CERCLA, Villeneuve d'Ascq Cedex, France E. Blomley, E. Bründermann, S. Funkner, A.-S. Müller, M.J. Nasse, G. Niehues, M. Schuh, P. Schönfeldt, J.L. Steinmann, S.W. Walter KIT, Karlsruhe, Germany J.B. Brubach, L. Manceron, P. Roy, M.-A. Tordeux SOLEIL, Gif-sur-Yvette, France C. Evain, C. Szwaj PhLAM/CERLA, Villeneuve d'Ascq, France N. Hiller PSI, Villigen PSI, Switzerland E. Roussel Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
	Single-shot electro-optic sampling (EOS) is a powerful characterization tool for monitoring the shape of electron bunches, and coherent synchrotron radiation pulses. For reaching high acquisition rates, an efficient possibility consists to associate classic EOS systems with the so-called photonic time-stretch technique [1]. We present recent results obtained at SOLEIL and ANKA using this strategy. In particular, we show how a high sensitivity variant of photonic time stretch [2] EOS enabled to monitor the CSR pulses emitted by short electron bunches at SOLEIL [3]. We could thus confirm in a very direct way the theories predicting an interplay between two physical processes. Below a critical bunch charge, we observe a train of identical THz pulses stemming from the shortness of the electron bunches. Above this threshold, CSR emission is dominated by drifting structures appearing through spontaneous self-organization. We also consider the association of time-stretch and EOS for recording electron bunch near fields at high repetition rate. We present preliminary results obtained at ANKA, aiming at recording the electron bunch shape evolution during the microbunching instability. [1] F. Coppinger et al. IEEE Trans. Microwave Theory Tech. 47, 1309 (1999). [2] C. Szwaj et al., Rev. Sci. Instruments 87, 103111 (2016). [3] C. Evain et al., Phys. Rev. Lett. 118, 054801 (2017).
	Slides TU1AB2 [72.925 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-TU1AB2
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WE2AB2	A Novel Nanotechnology Based Wire Scanner for Sub-Micrometer Resolution Measurements of the Electron Beam Profile at SwissFEL
	S. Borrelli, M. Bednarzik, Ch. David, E. Ferrari, A. Gobbo, V. Guzenko, N. Hiller, R. Ischebeck, G.L. Orlandi, C. Ozkan Loch, B. Rippstein, V. Schlott PSI, Villigen PSI, Switzerland
	SwissFEL wire-scanners (WSCs) are designed to provide minimally-invasive high resolution measurements of the electron beam profile and emittance during FEL operations. The wire-fork is equipped with two pairs of wires: 5um tungsten wire for high resolution measurements and 12.5 um Al(99):Si(1) wires for routine beam monitoring. The resolution limit is given by the wire diameter, a dimension in turn constrained to few micrometers by the wire manufacturing and mounting technique. An improvement of the WSC spatial resolution was triggered by the requirements for special SwissFEL machine operations and experimental applications where the beam transverse size will be at the sub-micrometer scale. In order to meet the resolution requirements, we make use of nanofabrication of sub-micrometer metallic stripes on a membrane by means of e-beam lithography. This presentation shall focus on the design, fabrication process and characterization of a high-resolution wire scanner prototype consisting of thin gold or nickel stripes with widths ranging from 2um down to 0.4um electroplated on a silicon nitride membrane. First results of the prototype electron beam tests will be also presented.
	Slides WE2AB2 [15.288 MB]
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Paper

Title

Page

Commissioning Results and First Operational Experience with SwissFEL Diagnostics

104

V. Schlott, V.R. Arsov, M. Baldinger, R. Baldinger, G. Bonderer, S. Borrelli, R. Ditter, D. Engeler, F. Frei, N. Hiller, R. Ischebeck, B. Keil, W. Koprek, R. Kramert, D. Llorente Sancho, A. Malatesta, F. Marcellini, G. Marinkovic, G.L. Orlandi, C. Ozkan Loch, P. Pollet, M. Roggli, M. Rohrer, M. Stadler, D.M. Treyer
PSI, Villigen PSI, Switzerland

SwissFEL is a free electron laser user facility at the Paul Scherrer Institute in Villigen, Switzerland designed to provide FEL radiation at photon energies ranging from 0.2 to 12 keV. Beam commissioning of the hard x-ray line ARAMIS has started in October 2016 and lasing at 300 eV was achieved in May 2017. First pilot user experiments at photon energies ≥ 2 keV are foreseen for the end of 2017. This contribution comprehends commissioning results and first operational experience of various diagnostics systems, such as beam position monitors, charge and loss monitors as well as transverse profile measurements with screens, wire scanners and synchrotron radiation monitors. It also provides information about sliced beam parameters using a transverse deflector and shows first results from the BC-1 compression monitor and measurements with the electron bunch arrival time monitors.

Poster MOPWC03 [1.088 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-MOPWC03

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

TU1AB2

High Repetition-Rate Electro-optic Sampling: Recent Studies Using Photonic Time-Stretch

121

S. Bielawski, M. Le Parquier
PhLAM/CERCLA, Villeneuve d'Ascq Cedex, France
E. Blomley, E. Bründermann, S. Funkner, A.-S. Müller, M.J. Nasse, G. Niehues, M. Schuh, P. Schönfeldt, J.L. Steinmann, S.W. Walter
KIT, Karlsruhe, Germany
J.B. Brubach, L. Manceron, P. Roy, M.-A. Tordeux
SOLEIL, Gif-sur-Yvette, France
C. Evain, C. Szwaj
PhLAM/CERLA, Villeneuve d'Ascq, France
N. Hiller
PSI, Villigen PSI, Switzerland
E. Roussel
Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy

Single-shot electro-optic sampling (EOS) is a powerful characterization tool for monitoring the shape of electron bunches, and coherent synchrotron radiation pulses. For reaching high acquisition rates, an efficient possibility consists to associate classic EOS systems with the so-called photonic time-stretch technique [1]. We present recent results obtained at SOLEIL and ANKA using this strategy. In particular, we show how a high sensitivity variant of photonic time stretch [2] EOS enabled to monitor the CSR pulses emitted by short electron bunches at SOLEIL [3]. We could thus confirm in a very direct way the theories predicting an interplay between two physical processes. Below a critical bunch charge, we observe a train of identical THz pulses stemming from the shortness of the electron bunches. Above this threshold, CSR emission is dominated by drifting structures appearing through spontaneous self-organization. We also consider the association of time-stretch and EOS for recording electron bunch near fields at high repetition rate. We present preliminary results obtained at ANKA, aiming at recording the electron bunch shape evolution during the microbunching instability.
[1] F. Coppinger et al. IEEE Trans. Microwave Theory Tech. 47, 1309 (1999).
[2] C. Szwaj et al., Rev. Sci. Instruments 87, 103111 (2016).
[3] C. Evain et al., Phys. Rev. Lett. 118, 054801 (2017).

Slides TU1AB2 [72.925 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-TU1AB2

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WE2AB2

A Novel Nanotechnology Based Wire Scanner for Sub-Micrometer Resolution Measurements of the Electron Beam Profile at SwissFEL

S. Borrelli, M. Bednarzik, Ch. David, E. Ferrari, A. Gobbo, V. Guzenko, N. Hiller, R. Ischebeck, G.L. Orlandi, C. Ozkan Loch, B. Rippstein, V. Schlott
PSI, Villigen PSI, Switzerland

SwissFEL wire-scanners (WSCs) are designed to provide minimally-invasive high resolution measurements of the electron beam profile and emittance during FEL operations. The wire-fork is equipped with two pairs of wires: 5um tungsten wire for high resolution measurements and 12.5 um Al(99):Si(1) wires for routine beam monitoring. The resolution limit is given by the wire diameter, a dimension in turn constrained to few micrometers by the wire manufacturing and mounting technique. An improvement of the WSC spatial resolution was triggered by the requirements for special SwissFEL machine operations and experimental applications where the beam transverse size will be at the sub-micrometer scale. In order to meet the resolution requirements, we make use of nanofabrication of sub-micrometer metallic stripes on a membrane by means of e-beam lithography. This presentation shall focus on the design, fabrication process and characterization of a high-resolution wire scanner prototype consisting of thin gold or nickel stripes with widths ranging from 2um down to 0.4um electroplated on a silicon nitride membrane. First results of the prototype electron beam tests will be also presented.

Slides WE2AB2 [15.288 MB]

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)