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IT06 Measurement of Small Transverse Beam Size Using Interferometry instrumentation, diagnostics, emittance 26
 
  • T. Mitsuhashi
    KEK, High Energy Accelerator Research Organization, Oho, Tsukuba, Ibaraki, Japan
  The principle of measurement of the profile or size of small objects through the spatial coherency of the light is known as the van Cittert-Zernike theorem. We developed the SR interferometer (interferometer for synchrotron radiation) to measure the spatial coherency of the visible region of the SR beam, and we demonstrated that this method is able to measure the beam profile and size. Since the small electron beam emits a SR beam which has a good spatial coherency, this method is suitable for measuring a small beam size. In this paper, the basic theory for the measurement of the profile or size of a small beam via the spatial coherency of the light, a design of the SR interferometer, and the results of beam profile measurement, examples of small beam size measurements and recent improvements are described.  
 
PS02 Bench Test of a Residual Gas Ionization Profile Monitor (Rgipm)
Work supported by U.S. Department of Energy 		instrumentation, diagnostics, emittance, LANL 102
 
  • W.C. Sellyey, J.D. Gilpatrick
    LANL, Los Alamos National Laboratory, Los Alamos, NM, USA
  • R. Senior
    GAC, General Atomics Corporation, San Diego, CA, USA
  An RGIPM has been designed, constructed and bench tested to verify that all components are functioning properly and that the desired resolution of about 50μm× rms can be achieved. This paper will describe some system details and it will compare observed results to detailed numerical calculations of expected detector response.