JLAB, Newport News, Virginia
CEA, Gif-sur-Yvette
PKU/IHIP, Beijing
ORNL, Oak Ridge, Tennessee
BNL, Upton, Long Island, New York
Buffered electropolishing (BEP) is a Nb surface treatment technique developed at Jefferson Lab1. Experimental results obtained from flat Nb samples show2-4 that BEP can produce a surface finish much smoother than that produced by the conventional electropolishing (EP), while Nb removal rate can be as high as 4.67 μm/min. This new technique has been applied to the treatments of Nb SRF single cell cavity employing a vertical polishing system5 constructed at JLab as well as a horizontal polishing system at CEA Saclay. Preliminary results show that the accelerating gradient can reach 32 MV/m for a large grain cavity and 26.7 MV/m for a regular grain cavity. In this presentation, the latest progresses from the international collaboration between Peking University, CEA Saclay, and JLab on BEP will be summarized.
KEK, Ibaraki
JLAB, Newport News, Virginia
GUAS/AS, Ibaraki
In this article, two subjects would be described. the first subject is on the production of stains on the surface of Nb sample plates in Electro-polishing (EP) process and the second subject is on the development of defects/pits in the EP process on the surface of a Nb sample plate. Recently, some 9-cell cavities were treated with new EP acid at KEK and the performance of these cavities were limited by heavy field emissions. On the inside surface of these cavities, brown stains were observed. We made an effort to reproduce the brown stains on Nb sample plates with an EP setup in laboratory with varying the concentration of Nibium in the EP acid. We found that the brown stains would appear only when processed with new EP acid. In the second subject, we made artificial pits on the surface of a Nb-sample plate and observed the development of the pits after each step of 30um-EP process where 120um was removed in total by the EP process. This article describes these series EP-tests with Nb sample plates at KEK.
KEK, Ibaraki
CEA, Gif-sur-Yvette
JLAB, Newport News, Virginia
GUAS/AS, Ibaraki
The Electro-Polishing (EP) process is the best candidate of final surface treatment for the production of ILC cavities. Nevertheless, the broad distribution of the gradient caused by field emitters in cavities is sitll a serious problem for the EP process. A candidate source of field emitter is the sulfur component which is produced in the EP process and remains the inner-surface of cavities. We studied the effect of Ethanole- and degreaser-rinse processes after the EP process by a unique method. Moreover, we tried to test the sponge cleaning as the post-EP process to remove the field emitter inside the cavcity. This article describe the results of series tests of the post-EP process at KEK.