Author: Noh, S.Y.
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MOPB037 Development of High Precision Capacitive Beam Phase Probe for KHIMA Project 121
 
  • J.G. Hwang, S.Y. Noh
    KIRAMS/KHIMA, Seoul, Republic of Korea
  • P. Forck
    GSI, Darmstadt, Germany
  • T.K. Yang
    KIRAMS, Seoul, Republic of Korea
 
  In the medium energy beam transport (MEBT) line of KHIMA project, a high precision beam phase probe monitor is required for a precise tuning of RF phase and amplitude of RFQ and IH-DTL. It is also used for measuring a kinetic energy of ion beam by time-of-flight (TOF) method using two phase probes. In this paper, we show the electromagnetic design of the high precision phase probe to satisfy the phase resolution of 1 deg (@ 200 MHz), the test result with a wire test bench to estimate a signal strength and phase accuracy, the design of the 0.2 ~ 2.0 GHz broad-band electronics for amplifying the signal strength, and the results of beam energy and RF frequency measurement using a proton beam from the cyclotron in KIRAMS.  
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MOPB038 Status of Beam Diagnostics at KHIMA Facility 126
 
  • T.K. Yang, D.H. An, G. Hahn, H. Yim
    KIRAMS, Seoul, Republic of Korea
  • J.G. Hwang, C.H. Kim, S.Y. Noh, C.W. Park
    KIRAMS/KHIMA, Seoul, Republic of Korea
 
  The Korea Heavy Ion Medical Accelerator(KHIMA) is the cancer therapy facility based on a synchrotron which can accelerate carbon ion to 430 MeV/u and proton to 230 MeV/u. The facility has 4 sectors; LEBT(Low Energy Beam Transport) from ECRIS to RFQ+IH-DTL, MEBT(Medium Energy Beam Transport) from IH-DTL to synchrotron, synchrotron ring, HEBT(High Energy Beam Transport) from the ring to irradiation rooms, 3 treatment rooms and 1 research room. The conceptual design report for each part of the facility has been completed and manufacturing of some parts has been started. In the case of beam diagnostics at the KHIMA, 17 types of monitors are considered and installation of 93 devices in total is planned including the related instruments like slit and stopper, stripper and etc. This proceeding introduces specifications of each diagnostic devices and shows test results of some monitoring devices to be already manufactured.  
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TUPB041 Development of Capacitive Linear-Cut Beam Position Monitor for Heavy-Ion Synchrotron of KHIMA Project 405
 
  • J.G. Hwang, S.Y. Noh
    KIRAMS/KHIMA, Seoul, Republic of Korea
  • P. Forck
    GSI, Darmstadt, Germany
  • C. Kim
    PAL, Pohang, Kyungbuk, Republic of Korea
  • T.K. Yang
    KIRAMS, Seoul, Republic of Korea
 
  particles for the carbon beams and ~ ∼  2.07 × 10zEhNZeHn for the proton beams, the linear-cut beam position monitor is adopted to satisfy the position resolution of 100 μm and accuracy of 200 μm with the linearity within the wide range. In this paper, we show the electromagnetic design of the electrode and surroundings to satisfy the resolution of 100 μm, the criteria for mechanical aspect to satisfy the position accuracy of 200 μm, the measurement results of position accuracy and calibration by using wire test-bench, and the beam-test results with long ( ∼  1.6 μs) electron beam in pohang accelerator laboratory (PAL).  
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TUPB043 Development of a Scintillation Screen Monitor for Transverse Ion Beam Profile Measurment at the Khima Project 410
 
  • S.Y. Noh, S.D. Chang, J.G. Hwang
    KIRAMS/KHIMA, Seoul, Republic of Korea
  • G. Hahn, T.K. Yang
    KIRAMS, Seoul, Republic of Korea
 
  The scintillation screen monitor measures transverse profile of ion beam in beam transport line. The Korea Heavy Ion Medical Accelerator Project (KHIMA) has developed a scintillation screen monitor in the high energy beam transport (HEBT) line. The images of each beam pulse were recorded by CCD camera and evaluated the beam properties by the LabVIEW-based in-house program in real time. We designed a scintillation screen monitor using phosphor screen, P43. In order to investigate the limits of scintillating screen during beam profile monitoring at low intensity, we designed a remote control device of iris for the incoming light adjustment to the CCD camera. In this paper, we present details of the image processing system using the LabVIEW and the beam profile measurement results from the in-beam test.  
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