Paper |
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TUPOT012 |
Microwave Frequency Dependence of the Properties of the Ion Beam Extracted From a Caprice Type ECRIS |
143 |
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- F. Maimone, R. Lang, J. Mäder, J. Roßbach, P. Spädtke, K. Tinschert
GSI, Darmstadt, Germany
- L. Celona
INFN/LNS, Catania, Italy
- F. Maimone
DMFCI, Catania, Italy
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In order to improve the quality of ion beams extracted from ECR ion sources it is mandatory to better understand the relations between the plasma conditions and the beam properties. The present investigations concentrate on the analysis of different beam properties under the influence of various applications of frequency tuning and of multiple frequency heating. The microwave frequency feeding the plasma affects the electromagnetic field distribution and the dimension and position of the ECR surface inside the plasma chamber. This in turn has an influence on the generation of the extracted ion beam in terms of its intensity, of its shape and of its emittance. In order to analyze the corresponding effects measurements have been performed with the Caprice type ECRIS installed at the ECR Injector Setup (EIS) of GSI. The experimental setup uses a new arrangement of one or more microwave sweep generators which feed a Traveling Wave Tube amplifier covering a wide frequency range from 12.5 to 18 GHz. This arrangement provides a precise determination of the frequencies and of the reflection coefficient along with the beam properties. A sequence of viewing targets positioned inside the beam line monitors the beam shape.
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Poster TUPOT012 [1.245 MB]
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MOPOT012 |
Tests of the Versatile Ion Source (VIS) for High Power Proton Beam Production |
61 |
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- S. Gammino, G. Castro, L. Celona, G. Ciavola, D. Mascali, R. Miracoli
INFN/LNS, Catania, Italy
- G. Adroit, O. Delferrière, R. Gobin, F. Senée
CEA/DSM/IRFU, France
- F. Maimone
GSI, Darmstadt, Germany
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The sources adapted to beam production for high power proton accelerators must obey to the request of high brightness, stability and reliability. The Versatile Ion Source (VIS) is based on permanent magnets (maximum value around 0.1 T on the chamber axis) producing an off-resonance microwave discharge. It operates up to 75 kV without a bulky high voltage platform, producing several tens of mA of proton beams and monocharged ions. The microwave injection system and the extraction electrodes geometry have been designed in order to optimize the beam brightness. Moreover, the VIS source ensures long time operations without maintenance and high reliability in order to fulfil the requirements of the future accelerators. A description of the main components and of the source performances will be given. A brief summary of the possible options for next developments of the project will be also presented, particularly for pulsed mode operations, that are relevant for some future projects (e.g. the European Spallation Source of Lund).
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WECOAK02 |
Some Considerations About Frequency Tuning Effect in ECRIS Plasmas |
165 |
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- D. Mascali, G. Castro, L. Celona, G. Ciavola, N. Gambino, S. Gammino, R. Miracoli, L. Neri
INFN/LNS, Catania, Italy
- F. Maimone
GSI, Darmstadt, Germany
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During the last years many experiments have demonstrated that slight variations in microwave frequency used to heat and sustain the plasma of ECRIS may strongly influence their performances (frequency tuning effect) both in terms of extracted current and mean charge state. Theoretical investigations revealed that this phenomenon can be correctly explained assuming that the plasma chamber works as a resonant cavity: standing waves are excited inside of it, and their spatial structure considerably changes even with slight variations of the pumping frequency. Therefore some particular modes present a higher electric field on the resonance surface, that is the only region in which the energy transfer from waves to electrons occurs. Experimental measurements carried out on microwave discharge plasmas at high density (up to 1011 cm-3) featured that even if the absorption of electromagnetic energy at the ECR surface is evident, the stochastic nature of the wave-electron interaction allows the wave to be reflected at the extraction flange, thus forming a standing wave. The model here proposed, and based on PIC and MonteCarlo collisional simulations, puts in evidence that the frequency tuning effect in ECRIS has a global influence on plasma properties: it strongly affects both ion and electron dynamics. Electron heating, electron density distribution, ion formation and acceleration at resonance surface, beam formation are determined by the particular mode excited inside the cavity. This means that the frequency tuning will be an important tool for future ECRIS for the optimization of the beam quality (emittance, etc.).
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Slides WECOAK02 [4.765 MB]
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THCOAK01 |
A Correction Scheme for the Hexapolar Error of an Ion Beam Extracted from an ECRIS |
191 |
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- P. Spädtke, R. Lang, J. Mäder, F. Maimone, J. Roßbach, K. Tinschert
GSI, Darmstadt, Germany
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The extraction of any ion beam from ECRIS is determined by the good confinement of such ion sources. It has been shown earlier, that the ions are coming from these places, where the confinement is weakest. The assumption that the low energy ions are strongly bound to the magnetic field lines require furthermore, that only these ions which start on a magnetic field line which go through the extraction aperture can be extracted. Depending on the setting of the magnetic field, these field lines may come from the loss lines at plasma chamber radius. Because the longitudinal position of these field lines depends on the azimuthal position at the extraction electrode, the ions are extracted from different magnetic flux densities. Whereas the solenoidal component is not curable, the hexapolar component can be compensated by an additional hexapole after the first beam line focusing solenoid. The hexapole has to be rotatable in azimuthal direction and moveable in longitudinal direction. For a good correction the beam needs to have such a radial phase space distribution, that the force given by this hexapole act on the aberrated beam exactly in such a way to create a linear distribution after that corrector.
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Slides THCOAK01 [1.115 MB]
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