Title | Other Keywords | Page |
---|---|---|
A Scanning Secondary Emission Profile Monitor | acceleration, background, cw, field | 553 |
|
||
Space-Charge Distortion in the Brookhaven Ionization Profile Monitor | field, ion, simulation, space-charge | 646 |
|
||
Emittance Growth in Intense Mismatched Beams | emittance, ion, simulation, space-charge | 1043 |
|