Title | Page |
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The 4X Source | 1797 |
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Beam Potential Measurement of an Intense H- Beam by Use of the Emissive Probe Technique | 1973 |
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Emittance Growth Caused by Current Variation in a Beam-Transport Channel | 2556 |
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Use of a Minimum-Elipse Criterion in the Study of Ion-Beam Extraction Systems | 2579 |
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Accelerator Column Models for Low-Current Beams | 2585 |
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