IPAC2016 - List of Authors (Full, S.J.)

Paper	Title	Page
TUPOR031	Trapped Ion Effects and Mitigation During High Current Operation in the Cornell DC Photoinjector	1735
SUPSS054	use link to see paper's listing under its alternate paper code
	S.J. Full, A.C. Bartnik, I.V. Bazarov, J. Dobbins, B.M. Dunham, G.H. Hoffstaetter Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
	Funding: U.S. Department of Energy (Grant No. DE-SC0012493), National Science Foundation (Award No. NSF-DMR 0807731) The Cornell high intensity photoinjector reaches a new regime of linac beam parameters where high continuous-wave electron beam currents lead to ion trapping. Above 10 mA, we have observed beam trips that limit stable machine operation to approximately 10^-15 minutes. By applying known ion clearing methods, the machine lifetime increases to at least 24 hours of continuous operation, suggesting that trapped ions are the most likely cause of the trips. In this paper we share some of our observations ion trapping in the photoinjector, as well as experimental tests of three common ion mitigation methods: clearing electrodes, beam shaking and bunch gaps.
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Paper

Title

Page

TUPOR031

Trapped Ion Effects and Mitigation During High Current Operation in the Cornell DC Photoinjector

1735

SUPSS054

use link to see paper's listing under its alternate paper code

S.J. Full, A.C. Bartnik, I.V. Bazarov, J. Dobbins, B.M. Dunham, G.H. Hoffstaetter
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA

Funding: U.S. Department of Energy (Grant No. DE-SC0012493), National Science Foundation (Award No. NSF-DMR 0807731)
The Cornell high intensity photoinjector reaches a new regime of linac beam parameters where high continuous-wave electron beam currents lead to ion trapping. Above 10 mA, we have observed beam trips that limit stable machine operation to approximately 10^-15 minutes. By applying known ion clearing methods, the machine lifetime increases to at least 24 hours of continuous operation, suggesting that trapped ions are the most likely cause of the trips. In this paper we share some of our observations ion trapping in the photoinjector, as well as experimental tests of three common ion mitigation methods: clearing electrodes, beam shaking and bunch gaps.

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reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)