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| WEPCC21 |
Beam Size Monitor Based on Multi-Silt Interferometer at SSRF |
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- B. Gao, H.J. Chen, J. Chen, Y.B. Leng, K.R. Ye
SINAP, Shanghai, People's Republic of China
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Double-silt synchrotron radiation interferometer is a common and useful tool to measure transverse beam size around the world. In order to satisfy the requirement of high speed measurement and improve the accuracy of BSM (beam size monitor), multi-silt interferometers have been designed and tested at SSRF. Multi-silt mask pattern has characteristics of high flux throughput and high SNR of the interferogram, which is very useful at high-speed beam size measurement. This technique has a relative complex algorithm to deconvolve the result image and figure out the beam size. Principle of the multi-silt SR interferometer, mask design and experiment will be present detailed in this paper.
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Poster WEPCC21 [1.081 MB]
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2017-WEPCC21
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