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RIS citation export for WEPCC21: Beam Size Monitor Based on Multi-Silt Interferometer at SSRF

TY - CONF
AU - Gao, B.
AU - Chen, H.J.
AU - Chen, J.
AU - Leng, Y.B.
AU - Ye, K.R.
ED - Liu, Zhengzheng
ED - Lidia, Steven
ED - McCausey, Amy
ED - Schaa, Volker RW
TI - Beam Size Monitor Based on Multi-Silt Interferometer at SSRF
J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017
C1 - Grand Rapids, MI, USA
T2 - International Beam Instrumentation Conference
T3 - 6
LA - english
AB - Double-silt synchrotron radiation interferometer is a common and useful tool to measure transverse beam size around the world. In order to satisfy the requirement of high speed measurement and improve the accuracy of BSM (beam size monitor), multi-silt interferometers have been designed and tested at SSRF. Multi-silt mask pattern has characteristics of high flux throughput and high SNR of the interferogram, which is very useful at high-speed beam size measurement. This technique has a relative complex algorithm to deconvolve the result image and figure out the beam size. Principle of the multi-silt SR interferometer, mask design and experiment will be present detailed in this paper.
PB - JACoW
CP - Geneva, Switzerland
SP - 408
EP - 410
KW - ion
KW - SRF
KW - synchrotron
KW - synchrotron-radiation
KW - emittance
DA - 2018/03
PY - 2018
SN - 978-3-95450-192-2
DO - 10.18429/JACoW-IBIC2017-WEPCC21
UR - http://jacow.org/ibic2017/papers/wepcc21.pdf
ER -