Author: Steinmann, J.L.
Paper Title Page
TU1AB2 High Repetition-Rate Electro-optic Sampling: Recent Studies Using Photonic Time-Stretch 121
 
  • S. Bielawski, M. Le Parquier
    PhLAM/CERCLA, Villeneuve d'Ascq Cedex, France
  • E. Blomley, E. Bründermann, S. Funkner, A.-S. Müller, M.J. Nasse, G. Niehues, M. Schuh, P. Schönfeldt, J.L. Steinmann, S.W. Walter
    KIT, Karlsruhe, Germany
  • J.B. Brubach, L. Manceron, P. Roy, M.-A. Tordeux
    SOLEIL, Gif-sur-Yvette, France
  • C. Evain, C. Szwaj
    PhLAM/CERLA, Villeneuve d'Ascq, France
  • N. Hiller
    PSI, Villigen PSI, Switzerland
  • E. Roussel
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
 
  Single-shot electro-optic sampling (EOS) is a powerful characterization tool for monitoring the shape of electron bunches, and coherent synchrotron radiation pulses. For reaching high acquisition rates, an efficient possibility consists to associate classic EOS systems with the so-called photonic time-stretch technique [1]. We present recent results obtained at SOLEIL and ANKA using this strategy. In particular, we show how a high sensitivity variant of photonic time stretch [2] EOS enabled to monitor the CSR pulses emitted by short electron bunches at SOLEIL [3]. We could thus confirm in a very direct way the theories predicting an interplay between two physical processes. Below a critical bunch charge, we observe a train of identical THz pulses stemming from the shortness of the electron bunches. Above this threshold, CSR emission is dominated by drifting structures appearing through spontaneous self-organization. We also consider the association of time-stretch and EOS for recording electron bunch near fields at high repetition rate. We present preliminary results obtained at ANKA, aiming at recording the electron bunch shape evolution during the microbunching instability.
[1] F. Coppinger et al. IEEE Trans. Microwave Theory Tech. 47, 1309 (1999).
[2] C. Szwaj et al., Rev. Sci. Instruments 87, 103111 (2016).
[3] C. Evain et al., Phys. Rev. Lett. 118, 054801 (2017).
 
slides icon Slides TU1AB2 [72.925 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-TU1AB2  
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TU2AB3 Single-Shot Longitudinal Beam Profile and Terahertz Diagnostics at MHz - Towards GHz-Rates with High-Throughput Electronics 136
 
  • M. Caselle, B.M. Balzer, M. Brosi, E. Bründermann, S. Funkner, B. Kehrer, A.-S. Müller, M.J. Nasse, G. Niehues, M.M. Patil, L. Rota, M. Schuh, P. Schönfeldt, J.L. Steinmann, M. Weber, M. Yan
    KIT, Eggenstein-Leopoldshafen, Germany
  • G. BORGHI,, M. Boscardin, S. Ronchin
    FBK, Trento, Italy
 
  Accelerators with high bunch-repetition rates mandate high-throughput detector electronics to diagnose each individual bunch. KALYPSO with a 256-pixel detector line-array integrated in an fs laser-based electro-optical set-up allows longitudinal bunch profiling with sub-ps resolution as demonstrated at the storage ring ANKA for single-bunch mode operation at 2.7 MHz and also at the Eu-XFEL with a 4.5-MHz micro-bunch train. Improvements will enhance fs-time accuracy, reduce noise, and increase frame-rate. A custom front-end with an application-specific integrated circuit (ASIC) has been developed to operate with 10-MHz frame-rates at low noise. Several linear arrays with up to 1024 pixel and smaller pixel pitch were submitted for production. The development of a low-gain avalanche diode (LGAD) sensor will further improve the time resolution. Detector data is transmitted in the DAQ framework to external GPU-based clusters and processed in real-time at 7 Gbytes/s with a few μs latency. For beam dynamics studies we also develop KAPTURE capable to analyze terahertz detector pulses at GHz-repetition rates. These developments open new windows in beam diagnostics of modern accelerators.  
slides icon Slides TU2AB3 [1.906 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-TU2AB3  
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