IBIC2017 - List of Authors (Mitrofanov, S.V.)

Paper	Title	Page
MOPCF10	Estimation of Heavy Ion Beam Parameters During Single Event Effects Testing	94
	V.S. Anashin United Rocket and Space Corporation, Institute of Space Device Engineering, Moscow, Russia P.A. Chubunov, G.A. Protopopov ISDE, Moscow, Russia S.V. Mitrofanov, V.A. Skuratov, Yu.G. Teterev JINR, Dubna, Moscow Region, Russia
	Funding: This work was sponsored by the Russian Federal Space Agency by special agreement between Institute of Space Device Engineering and Joint Institute for Nuclear Research. During flight mission onboard electronic equipment of spacecraft exposed to outer space radiation. Impact of charged particles leads to errors and failures in electronic components. The most critical problem for spacecraft engineers is heavy ions influence which cause single event effects (SEE) in electronic components. To be assure that spacecraft electronics will work properly during the mission ground SEE testing is needed. For these purposes heavy ions accelerators are used. In this report, we will discuss requirements to heavy ions beams, techniques and equipment used for control heavy ion beam parameters during SEE testing. Special attention will be given to description of flux and fluence control procedure.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-MOPCF10
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Estimation of Heavy Ion Beam Parameters During Single Event Effects Testing

94

V.S. Anashin
United Rocket and Space Corporation, Institute of Space Device Engineering, Moscow, Russia
P.A. Chubunov, G.A. Protopopov
ISDE, Moscow, Russia
S.V. Mitrofanov, V.A. Skuratov, Yu.G. Teterev
JINR, Dubna, Moscow Region, Russia

Funding: This work was sponsored by the Russian Federal Space Agency by special agreement between Institute of Space Device Engineering and Joint Institute for Nuclear Research.
During flight mission onboard electronic equipment of spacecraft exposed to outer space radiation. Impact of charged particles leads to errors and failures in electronic components. The most critical problem for spacecraft engineers is heavy ions influence which cause single event effects (SEE) in electronic components. To be assure that spacecraft electronics will work properly during the mission ground SEE testing is needed. For these purposes heavy ions accelerators are used. In this report, we will discuss requirements to heavy ions beams, techniques and equipment used for control heavy ion beam parameters during SEE testing. Special attention will be given to description of flux and fluence control procedure.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-MOPCF10

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)