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RIS citation export for MOPCF10: Estimation of Heavy Ion Beam Parameters During Single Event Effects Testing

TY - CONF
AU - Anashin, V.S.
AU - Chubunov, P.A.
AU - Mitrofanov, S.V.
AU - Protopopov, G.A.
AU - Skuratov, V.A.
AU - Teterev, Yu.G.
ED - Liu, Zhengzheng
ED - Lidia, Steven
ED - McCausey, Amy
ED - Schaa, Volker RW
TI - Estimation of Heavy Ion Beam Parameters During Single Event Effects Testing
J2 - Proc. of IBIC2017, Grand Rapids, MI, USA, 20-24 August 2017
C1 - Grand Rapids, MI, USA
T2 - International Beam Instrumentation Conference
T3 - 6
LA - english
AB - During flight mission onboard electronic equipment of spacecraft exposed to outer space radiation. Impact of charged particles leads to errors and failures in electronic components. The most critical problem for spacecraft engineers is heavy ions influence which cause single event effects (SEE) in electronic components. To be assure that spacecraft electronics will work properly during the mission ground SEE testing is needed. For these purposes heavy ions accelerators are used. In this report, we will discuss requirements to heavy ions beams, techniques and equipment used for control heavy ion beam parameters during SEE testing. Special attention will be given to description of flux and fluence control procedure.
PB - JACoW
CP - Geneva, Switzerland
SP - 94
EP - 97
KW - ion
KW - radiation
KW - vacuum
KW - electron
KW - controls
DA - 2018/03
PY - 2018
SN - 978-3-95450-192-2
DO - 10.18429/JACoW-IBIC2017-MOPCF10
UR - http://jacow.org/ibic2017/papers/mopcf10.pdf
ER -