IBIC2017 - List of Authors (Gobbo, A.)

Paper	Title	Page
WE2AB2	A Novel Nanotechnology Based Wire Scanner for Sub-Micrometer Resolution Measurements of the Electron Beam Profile at SwissFEL
	S. Borrelli, M. Bednarzik, Ch. David, E. Ferrari, A. Gobbo, V. Guzenko, N. Hiller, R. Ischebeck, G.L. Orlandi, C. Ozkan Loch, B. Rippstein, V. Schlott PSI, Villigen PSI, Switzerland
	SwissFEL wire-scanners (WSCs) are designed to provide minimally-invasive high resolution measurements of the electron beam profile and emittance during FEL operations. The wire-fork is equipped with two pairs of wires: 5um tungsten wire for high resolution measurements and 12.5 um Al(99):Si(1) wires for routine beam monitoring. The resolution limit is given by the wire diameter, a dimension in turn constrained to few micrometers by the wire manufacturing and mounting technique. An improvement of the WSC spatial resolution was triggered by the requirements for special SwissFEL machine operations and experimental applications where the beam transverse size will be at the sub-micrometer scale. In order to meet the resolution requirements, we make use of nanofabrication of sub-micrometer metallic stripes on a membrane by means of e-beam lithography. This presentation shall focus on the design, fabrication process and characterization of a high-resolution wire scanner prototype consisting of thin gold or nickel stripes with widths ranging from 2um down to 0.4um electroplated on a silicon nitride membrane. First results of the prototype electron beam tests will be also presented.
	Slides WE2AB2 [15.288 MB]
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WEPCC16	First Experimental Results of the Commissioning of the SwissFEL Wire-Scanners	388
	G.L. Orlandi, A.D. Alarcon, S. Borrelli, A. Gobbo, P. Heimgartner, R. Ischebeck, D. Llorente Sancho, F. Löhl, C. Ozkan Loch, P. Pollet, B. Rippstein, V. Schlott PSI, Villigen PSI, Switzerland R. Vintar Cosylab, Ljubljana, Slovenia
	Several wire-scanners - 19 out of 22 - are presently installed in SwissFEL, the hard X-ray FEL facility under commissioning at Paul Scherrer Institut (www.psi.ch). Thanks to a wire-fork designed to be equipped with two different pairs of scanning wires (5 um tungsten and 12.5 um Al(99):Si(1)), high resolution measurements of the beam profile - and emittance - and, alternatively, a minimally-invasive beam monitoring during FEL operations can be performed. First experimental results of the SwissFEL wire-scanner commissioning will be presented as well as a summary of the prototyping design and characterization.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-WEPCC16
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Paper

Title

Page

WE2AB2

A Novel Nanotechnology Based Wire Scanner for Sub-Micrometer Resolution Measurements of the Electron Beam Profile at SwissFEL

S. Borrelli, M. Bednarzik, Ch. David, E. Ferrari, A. Gobbo, V. Guzenko, N. Hiller, R. Ischebeck, G.L. Orlandi, C. Ozkan Loch, B. Rippstein, V. Schlott
PSI, Villigen PSI, Switzerland

SwissFEL wire-scanners (WSCs) are designed to provide minimally-invasive high resolution measurements of the electron beam profile and emittance during FEL operations. The wire-fork is equipped with two pairs of wires: 5um tungsten wire for high resolution measurements and 12.5 um Al(99):Si(1) wires for routine beam monitoring. The resolution limit is given by the wire diameter, a dimension in turn constrained to few micrometers by the wire manufacturing and mounting technique. An improvement of the WSC spatial resolution was triggered by the requirements for special SwissFEL machine operations and experimental applications where the beam transverse size will be at the sub-micrometer scale. In order to meet the resolution requirements, we make use of nanofabrication of sub-micrometer metallic stripes on a membrane by means of e-beam lithography. This presentation shall focus on the design, fabrication process and characterization of a high-resolution wire scanner prototype consisting of thin gold or nickel stripes with widths ranging from 2um down to 0.4um electroplated on a silicon nitride membrane. First results of the prototype electron beam tests will be also presented.

Slides WE2AB2 [15.288 MB]

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPCC16

First Experimental Results of the Commissioning of the SwissFEL Wire-Scanners

388

G.L. Orlandi, A.D. Alarcon, S. Borrelli, A. Gobbo, P. Heimgartner, R. Ischebeck, D. Llorente Sancho, F. Löhl, C. Ozkan Loch, P. Pollet, B. Rippstein, V. Schlott
PSI, Villigen PSI, Switzerland
R. Vintar
Cosylab, Ljubljana, Slovenia

Several wire-scanners - 19 out of 22 - are presently installed in SwissFEL, the hard X-ray FEL facility under commissioning at Paul Scherrer Institut (www.psi.ch). Thanks to a wire-fork designed to be equipped with two different pairs of scanning wires (5 um tungsten and 12.5 um Al(99):Si(1)), high resolution measurements of the beam profile - and emittance - and, alternatively, a minimally-invasive beam monitoring during FEL operations can be performed. First experimental results of the SwissFEL wire-scanner commissioning will be presented as well as a summary of the prototyping design and characterization.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2017-WEPCC16

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)