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| WEPCC21 |
Beam Size Monitor Based on Multi-Silt Interferometer at SSRF |
408 |
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- B. Gao, H.J. Chen, J. Chen, Y.B. Leng, K.R. Ye
SINAP, Shanghai, People's Republic of China
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Double-silt synchrotron radiation interferometer is a common and useful tool to measure transverse beam size around the world. In order to satisfy the requirement of high speed measurement and improve the accuracy of BSM (beam size monitor), multi-silt interferometers have been designed and tested at SSRF. Multi-silt mask pattern has characteristics of high flux throughput and high SNR of the interferogram, which is very useful at high-speed beam size measurement. This technique has a relative complex algorithm to deconvolve the result image and figure out the beam size. Principle of the multi-silt SR interferometer, mask design and experiment will be present detailed in this paper.
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Poster WEPCC21 [1.081 MB]
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2017-WEPCC21
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| WEPCF02 |
A Study on the Resolution of Bunch Length Measurement System Using Harmonic Method |
415 |
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- Q. Wang, Q. Luo, B.G. Sun
USTC/NSRL, Hefei, Anhui, People's Republic of China
- B. Gao, Y.B. Leng
SINAP, Shanghai, People's Republic of China
- B. Gao
University of Chinese Academy of Sciences, Beijing, People's Republic of China
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Funding: Supported by The National Key Research and Development Program of China (2016YFA0401900), NSFC (11575181, 11375178) and the Fundamental Research Funds for the Central Universities (WK2310000046)
Harmonic method is very useful when we try to obtain the bunch length, while its resolution is always influenced by many factors. In this paper, the relations between resolution and working frequencies of two cavities are given by mathematical deduction. The laws of resolution change caused by some decisive factors such as beam position, working frequency, electromagnetic mode and probe position are obtained through simulation on computer. An improved measurement method utilizing TM020 mode is presented based on the theory above. The simulation results show that the improved method can enhance the resolution capability of the bunch length monitor and these analyses can provide references for the design of cavity bunch length monitor.
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2017-WEPCF02
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| TH2AB2 |
Bunch-by-Bunch Beam Length Measurement Using Two-Frequency System at SSRF |
499 |
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- H.J. Chen, L.W. Duan, B. Gao, L.W. Lai, Y.B. Leng
SINAP, Shanghai, People's Republic of China
- N. Zhang
SSRF, Shanghai, People's Republic of China
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A Two-frequency method has been implemented for bunch length measurement at Shanghai Synchrotron Radiation Facility (SSRF). It is based on the information from two harmonic frequencies of Flourier Transformation of longitudinal charge distribution. We select 500MHz and 3GHz as working frequency and the system consists of power splitters, band-pass filters and a mixer. Raw data are acquired by a digital oscilloscope and analyzed by MATLAB code. The system has been calibrated by Streak Camera in single-bunch experiment environment with bunch charge from 0.23nC to 6.05nC. The paper also shows bunch length synchronous oscillation phenomenon during injection period.
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Slides TH2AB2 [3.638 MB]
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2017-TH2AB2
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