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- G. Berden, G.M.H. Knippels, D. Oepts, A.F.G. van der Meer
FOM, Institute for Plasma Physics 'Rijnhuizen', Nieuwegein, The Netherlands
- S.P. Jamison, X. Yan, A.M. MacLeod, W.A. Gillespie
Abertay, University of Abertay Dundee, Dundee, UK
- J.L. Shen
CNU, Capital Normal University, Beijing, China
- I. Wilke
RPI, Rensselaer Polytechnic Institute, Troy, NY, USA
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It is recognised by the Instrumentation community that 4th generation
light sources (like TESLA, LCLS) are posing some of the most stringent
requirements on beam diagnostics. Among these, the single-shot
electro-optic measurement of the bunch length and shape in the
sub-picosecond domain is an ongoing development.
The electro-optic detection method makes use of the fact that the local
electric field of a highly relativistic electron bunch moving in a
straight line is almost entirely concentrated perpendicular to its
direction of motion. This electric field makes an electro-optic crystal
placed in the vicinity of the beam birefringent. The amount of
birefringence depends on the electric field and is probed by monitoring
the change of polarization of the wavelength components of a chirped,
synchronized Ti:sapphire laser pulse.
This talk will provide details of the experimental setup at the Free
Electron Laser for Infrared eXperiments (FELIX) in Nieuwegein, The
Netherlands, where single shot images have been obtained of 1.7 ps long
electron bunches (beam energy 46 MeV, charge per bunch 200 pC).
Furthermore, future upgrading possibilities will be discussed.
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