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Mitsuhashi, T.

Paper Title Page
IT06 Measurement of Small Transverse Beam Size Using Interferometry 26
 
  • T. Mitsuhashi
    KEK, High Energy Accelerator Research Organization, Oho, Tsukuba, Ibaraki, Japan
 
  The principle of measurement of the profile or size of small objects through the spatial coherency of the light is known as the van Cittert-Zernike theorem. We developed the SR interferometer (interferometer for synchrotron radiation) to measure the spatial coherency of the visible region of the SR beam, and we demonstrated that this method is able to measure the beam profile and size. Since the small electron beam emits a SR beam which has a good spatial coherency, this method is suitable for measuring a small beam size. In this paper, the basic theory for the measurement of the profile or size of a small beam via the spatial coherency of the light, a design of the SR interferometer, and the results of beam profile measurement, examples of small beam size measurements and recent improvements are described.