Author: Lauth, W.
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TUPB011 Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective 327
 
  • G. Kube, S. Bajt
    DESY, Hamburg, Germany
  • I.A. Artyukov
    LPI, Moscow, Russia
  • W. Lauth
    IKP, Mainz, Germany
  • A. Potylitsyn, L.G. Sukhikh, A.V. Vukolov
    TPU, Tomsk, Russia
  
  Funding: The work was partially supported by the Russian Ministry of Education and Science within the program Nauka Grant No. 3.709.2014/K
Transverse beam profile diagnostics in the case of micron-scale beam sizes from modern electron accelerators are a challenging task. Backward transition radiation (BTR) imaging in the visible spectral region which is usually applied is close to the diffraction limit, i.e. the measured beam image is dominated by the point-spread function (PSF) [*, **]. In order to improve the resolution and to measure sub-micron beam sizes, the influence of the PSF should be decreased which depends not only on the wavelength, but also on optical aberrations. This can be realized by imaging in the EUV spectral region using a multilayer Schwarzschild objective which is free of some types of aberrations [***]. A first test experiment devoted to micron-scale beam size measurements has been carried out at the Mainz Microtron MAMI (Germany), using visible BTR and a Schwarzschild objective. This report summarizes first results of PSF dominated imaging with vertical beam sizes in the order of a few microns. Possibilities to extend the use of a Schwarzschild objective in future experiments with EUV BTR will be discussed.
* P. Karataev et al., PRL 107 (2011) 174801.
** G. Kube et al., proc. of IPAC13 (2013) MOPME010.
*** I.A. Artyukov et al, Opt. Eng. 39 (2000) 2163. 		 
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TUPB012 Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen 330
 
  • G. Kube, S. Bajt
    DESY, Hamburg, Germany
  • I.A. Artyukov
    LPI, Moscow, Russia
  • W. Lauth
    IKP, Mainz, Germany
  • A. Potylitsyn, L.G. Sukhikh, A.V. Vukolov
    TPU, Tomsk, Russia
  
  Funding: This work was partly supported by the by the Russian Ministry of Education and Science within the program 'Nauka' Grant No. 3.709.2014/K.
Standard beam profile measurements of high-brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the micro-bunching instability which render a direct beam imaging impossible. As consequence, for modern linac based 4th generation light sources as the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. However, the resolution of a scintillator based monitor is limited due to intrinsic material properties and the observation geometry [*,**]. In this report we present the results of beam size measurements in the order of a few microns using a LYSO:Ce scintillator and discuss the possible achievable resolution.
[*] G. Kube et al., Proc. IPAC'12 (2012) WEOAA02.
[**] B. Walasek-Höhne and G. Kube, Proc. DIPAC'11 (2011) WEOB01.
 		 
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