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TY - CPAPER AU - Kube, G. AU - Artyukov, I.A. AU - Bajt, S. AU - Lauth, W. AU - Potylitsyn, A. AU - Sukhikh, L.G. AU - Vukolov, A.V. TI - Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen J2 - Proc. of International Beam Instrumentation Conference (IBIC2015), Melbourne, Australia, 13-17 September 2015 AB - Standard beam profile measurements of high-brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the micro-bunching instability which render a direct beam imaging impossible. As consequence, for modern linac based 4th generation light sources as the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. However, the resolution of a scintillator based monitor is limited due to intrinsic material properties and the observation geometry [*,**]. In this report we present the results of beam size measurements in the order of a few microns using a LYSO:Ce scintillator and discuss the possible achievable resolution. PB - JACoW CY - Geneva, Switzerland SP - 330 EP - 334 KW - electron KW - experiment KW - simulation KW - radiation KW - optics DA - 2016/01 PY - 2016 SN - 978-3-95450-176-2 DO - 10.18429/JACoW-IBIC2015-TUPB012 UR - http://accelconf.web.cern.ch/AccelConf/IBIC2015/papers/tupb012.pdf ER -