Paper |
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Other Keywords |
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MOPF22 |
The Effect of Space Charge Along the Tomography Section at PITZ |
space-charge, emittance, transverse, simulation |
255 |
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- G. Kourkafas, M. Khojoyan, M. Krasilnikov, D. Malyutin, B. Marchetti, M. Otevřel, F. Stephan, G. Vashchenko
DESY Zeuthen, Zeuthen, Germany
- G. Asova
INRNE, Sofia, Bulgaria
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The Photo Injector Test facility at DESY, Zeuthen site (PITZ) focuses on testing, characterizing and optimizing high brightness electron sources for free electron lasers. Among various diagnostic tools installed at PITZ, the tomography module is used to reconstruct the transverse phase-space distribution of the electron beam by capturing its projections while rotating in the normalized phase space. This technique can resolve the two transverse planes simultaneously with an improved signal-to-noise ratio, allowing measurements of individual bunches within a bunch train with kicker magnets. The low emittance, high charge density and moderate energy of the electron bunch at PITZ contribute to significant space-charge forces which induce mismatches to the reconstruction procedure. This study investigates how the phase-space transformations and thus the reconstruction result are affected when considering linear and non-linear self-fields along the tomography section for the design Twiss parameters. The described analysis proposes a preliminary approach for including the effect of space charge in the tomographic reconstruction at PITZ.
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Poster MOPF22 [1.312 MB]
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WEPF25 |
Resonator for Charge Measurement at REGAE |
DESY, controls, XFEL, LEFT |
872 |
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- D. Lipka, J. Lund-Nielsen, M. Seebach
DESY, Hamburg, Germany
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A resonator has been developed for the diagnostics of dark current and charge measurements at the European XFEL, FLASH and PITZ. The first induced monopole mode TM01 at 1.3 GHz from charged bunches is used to detect the dark current and charge with high resolution at these accelerators. At REGAE this resonator with electronics is installed to detect the bunch charge because charges below pC are used and this device can resolve it non-destructively. The same electronics as for the dark current and charge measurement is used and the resolution is measured to be 2.3 fC for 200 fC.
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Poster WEPF25 [0.822 MB]
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