Keyword: MCP
Paper Title Other Keywords Page
MOPC36 Test of a Non-Invasive Bunch Shape Monitor at GSI High Current LINAC electron, linac, longitudinal, GSI 151
 
  • P. Forck, C. Dorn, O.K. Kester, P. Kowina, B. Zwicker
    GSI, Darmstadt, Germany
  • O.K. Kester
    IAP, Frankfurt am Main, Germany
  
  Funding: The work is funded by European Union FP7 within CRISP.
At the heavy ion LINAC at GSI, a novel scheme of non-invasive Bunch Shape Monitor has been tested with several ion beams at 11.4 MeV/u. The monitor’s principle is based on the analysis of secondary electrons as liberated from the residual gas by the beam impact. These electrons are accelerated by an electrostatic field, transported through a sophisticated electrostatic energy analyzer and an RF-deflector, acting as a time-to-space converter. Finally a MCP amplifies electrons and with a CCD camera the electron distribution is detected. For the applied beam settings this Bunch Shape Monitor is able to obtain longitudinal profiles down to a width of 400 ps with a resolution of 50 ps, corresponding to 2 degree of the 108 MHz accelerating frequency. Systematic parameter studies for the device were performed to demonstrate the applicability and to determine its resolution. The achievements and ongoing improvements for the monitor are discussed. 		 
poster icon Poster MOPC36 [2.665 MB]  
 
TUPF02 Secondary Emission Monitor for keV Ion and Antiproton Beams antiproton, electron, CERN, ion 495
 
  • A.G. Sosa, E. Bravin, A. Jeff
    CERN, Geneva, Switzerland
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
  
  Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN*. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
* Measurements at the AD carried out with the AEgIS collaboration. 		 
poster icon Poster TUPF02 [1.934 MB]  
 
WEPC20 Bunch Extension Monitor for LINAC of SPIRAL2 facility linac, ion, photon, diagnostics 720
 
  • R.V. Revenko, J.L. Vignet
    GANIL, Caen, France
  
  Funding: This work is funded in frame of CRISP project.
Measurements of the bunch longitudinal shape of beam particles are crucial for optimization and control of the LINAC beam parameters and maximization of its integrated luminosity. The non-interceptive bunch extension monitor for LINAC of SPIRAL2 facility is being developed at GANIL. The five bunch extension monitors are to be installed on the entrance of LINAC between superconducting cavities. The principle of monitor operation is based on registration of x-rays induced by ions of accelerator beam and emitted from thin tungsten wire. The monitor consists of two parts: system for wire insertion and positioning and x-ray detector based on microchannel plates. The prototype of detector has been developed and was tested using protons and heavy ions beams. 		 
poster icon Poster WEPC20 [9.366 MB]  
 
WEPF14 A New Low Intensity Beam Profile Monitor for SPIRAL2 electron, SPIRAL2, simulation, permanent-magnet 841
 
  • J.L. Vignet, P. Gangnant, E. Guéroult, J. Pancin
    GANIL, Caen, France
  
  In order to obtain profiles of SPIRAL 2 ion beams, several beam profile monitors are presently being developed at GANIL. One of them is a low-intensity beam-profile monitor (EFM). This Emission-Foil Monitor (EFM) will be used in the radioactive beam lines of SPIRAL2 and in the experimental rooms of this new facility. The ions produce secondary electrons when they are stopped in an aluminium emissive foil. The electrons are then guided in an electric field placed parallel to a magnetic field in a double-stage microchannel plate (MCP). A 2D pixelated pad plane placed below the MCP is then used to collect the signal. The magnetic field created by permanent magnets in a closed magnetic circuit configuration permits the beam-profile reconstruction to be achieved with good resolution. The EFM can visualize beam-profile intensities between only a few pps to as much as 109 pps and with energies as low as several keV. This profiler has been under development since 2011 and is actually manufactured. For the signal acquisition, a new dedicated electronics system will be employed. Recent results of this monitor and its associated electronics will be presented here.