IBIC2012 - List of Authors (Naito, T.)

Paper

Title

Page

Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF

215

T. Naito, H. Hayano, K. Kubo, S. Kuroda, N. Nakamura, T. Okugi, H. Sakai, N. Terunuma, J. Urakawa
KEK, Ibaraki, Japan

The X-ray profile monitor (XPM) is used for the beam size measurement in the KEK-ATF damping ring(ATF-DR) at all times. The XPM consists of a crystal monochromator, two Fresnel zone plates(FZPs) and X-ray CCD camera. Two FZPs make the imaging optics. The design resolution of the selected wavelength 3.8nm is less than 1μm, which is sufficiently small for the emittance measurement of the ATF-DR. However, the measured results at the early stage were affected by the mechanical vibration. This paper describes the improvement of the resolution and the measurement results.

WECC03

Intensity Imbalance Optical Interferometer Beam Size Monitor

566

M.J. Boland
ASCo, Clayton, Victoria, Australia
T.M. Mitsuhashi, T. Naito
KEK, Ibaraki, Japan
K.P. Wootton
The University of Melbourne, Melbourne, Australia

The technique of measuring the beam size in a particle accelerator with an optical interferometer with the Mitsuhashi apparatus is well established and one of the only direct measurement techniques available. However, one of the limitations of the technique is the dynamic range and noise level of CCD cameras when measuring ultra low emittance beams and hence visibilities close to unity. A new design has been successfully tested to overcome these limitations by introducing a know intensity imbalance in one of the light paths of the interferometer. This modification reduces the visibility in a controlled way and lifts the measured interference pattern out of the noise level of the CCD, thus increasing the dynamic range of the apparatus. Results are presented from tests at the ATF2 at KEK and on the optical diagnostic beamline at the Australian Synchrotron storage ring.

Slides WECC03 [2.383 MB]

Paper	Title	Page
MOPB63	Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF	215
	T. Naito, H. Hayano, K. Kubo, S. Kuroda, N. Nakamura, T. Okugi, H. Sakai, N. Terunuma, J. Urakawa KEK, Ibaraki, Japan
	The X-ray profile monitor (XPM) is used for the beam size measurement in the KEK-ATF damping ring(ATF-DR) at all times. The XPM consists of a crystal monochromator, two Fresnel zone plates(FZPs) and X-ray CCD camera. Two FZPs make the imaging optics. The design resolution of the selected wavelength 3.8nm is less than 1μm, which is sufficiently small for the emittance measurement of the ATF-DR. However, the measured results at the early stage were affected by the mechanical vibration. This paper describes the improvement of the resolution and the measurement results.

WECC03	Intensity Imbalance Optical Interferometer Beam Size Monitor	566
	M.J. Boland ASCo, Clayton, Victoria, Australia T.M. Mitsuhashi, T. Naito KEK, Ibaraki, Japan K.P. Wootton The University of Melbourne, Melbourne, Australia
	The technique of measuring the beam size in a particle accelerator with an optical interferometer with the Mitsuhashi apparatus is well established and one of the only direct measurement techniques available. However, one of the limitations of the technique is the dynamic range and noise level of CCD cameras when measuring ultra low emittance beams and hence visibilities close to unity. A new design has been successfully tested to overcome these limitations by introducing a know intensity imbalance in one of the light paths of the interferometer. This modification reduces the visibility in a controlled way and lifts the measured interference pattern out of the noise level of the CCD, thus increasing the dynamic range of the apparatus. Results are presented from tests at the ATF2 at KEK and on the optical diagnostic beamline at the Australian Synchrotron storage ring.
	Slides WECC03 [2.383 MB]