Paper | Title | Other Keywords | Page |
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MOP261 | A Test Facility for MEIC ERL Circulator Ring Based Electron Cooler Design | electron, SRF, FEL, kicker | 219 |
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Funding: * Supported by the U.S. Department of Energy, Office of Nuclear Physics, under Contract No. DE-AC05-06OR23177 and DE-AC02-06CH11357. An electron cooling facility which is capable to deliver a beam with energy up to 55 MeV and average current up to 1.5 A at a high bunch repetition rate up to 750 MHz is required for MEIC. The present cooler design concept is based on a magnetized photo-cathode SRF gun, an SRF ERL and a compact circulator ring. In this paper, we present a proposal of a test facility utilizing the JLab FEL ERL for a technology demonstration of this cooler design concept. Beam studies will be performed and supporting technologies will also be developed in this test facility |
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TUO1C01 | Recent Developments on High Intensity Beam Diagnostics at SNS | electron, proton, target, simulation | 292 |
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Funding: ORNL/SNS is managed by UT-Battelle, LLC, for the U.S. Department of Energy under contract DE-AC05-00OR22725. The Spallation Neutron Source Ring accumulates 0.6 μs long proton bunches of up to 1.6·1014 protons with a typical peak current of over 50 A during a 1 ms cycle. To qualify the beam, we perform different transverse profile measurements that can be done at full intensity. The electron beam scanner performs a non-invasive measurement of the transverse and longitudinal profiles of the beam in the ring. Electrons passing over and through the proton beam are deflected and projected on a fluorescent screen. Analysis of the projection yields the transverse profile while multi transverse profiles offset in time yield the longitudinal profile. Progress made with this system will be discussed as well as temperature measurements of the stripping foil and other transverse measurements. |
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Slides TUO1C01 [15.498 MB] | ||
THO3C03 | Beam Induced Fluorescence - Profile Monitoring for Targets and Transport | vacuum, electron, ion, target | 586 |
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Online profile diagnostic is preferred to monitor intense hadron beams at the Facility of Antiproton and Ion Research (FAIR). One instrument for beam profile measurement is the gas based Beam Induced Fluorescence (BIF)-monitor. It relies on the optical fluorescence of residual gas, excited by beam particles. In front of production targets for radioactive ion beams or in plasma physics applications, vacuum constraints are less restrictive and allow a sufficient number of fluorescence photons, even at minimum ionizing energies. Unwanted effects like radiation damage and radiation induced background need to be addressed as well. A profile comparison of BIF and Ionization Profile Monitor (IPM) in nitrogen and rare gases is presented. We studied the BIF method from 10-3 to 30 mbar with an imaging spectrograph. Preferable fluorescence transitions and fundamental limitations are discussed. | |||
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Slides THO3C03 [7.371 MB] | ||