Paper |
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MOPD65 |
Sensitivity Optimization of the Standard Beam Current Monitors for XFEL and FLASH II |
197 |
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- M. Werner, J. Lund-Nielsen, Re. Neumann, N. Wentowski
DESY, Hamburg, Germany
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There is a tendency to operate 4th generation SASE driven light sources at very low charge in order to further shorten the pulse length. Therefore the operation range of XFEL and FLASH II was extended to a charge range of as low as 20 pC to 1 nC. For a reliable charge measurement down to 20 pC, a low noise design of the signal chain from the monitor head to the digitizing ADC is necessary. This paper describes the steps taken in order to increase the sensitivity and dynamic range of the monitors currently used in the FLASH accelerator, and the basic theoretical background will be explained. Finally, first results are presented.
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Poster MOPD65 [0.768 MB]
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