Author: Papaevangelou, T.
Paper Title Page
WEOA03 Detailed Experimental Characterization of an Ionization Profile Monitor 547
 
  • J. Egberts, P. Abbon, F. Jeanneau, J.-Ph. Mols, T. Papaevangelou
    CEA, Gif-sur-Yvette, France
  • F. Becker, P. Forck, B. Walasek-Höhne
    GSI, Darmstadt, Germany
  • J. Marroncle
    CEA/DSM/IRFU, France
 
  Funding: Marie Curie Fellowship by the EU
In the frame of the International Fusion Material Irradiation Facility (IFMIF), a prototype for a non-interceptive transverse beam profile monitor based on residual gas ionization (IPM) has been built and characterized in detail. We present results of test measurements performed at CEA Saclay with 80 keV protons in a cw beam of up to 10 mA and at GSI Darmstadt with pulsed Ca10+, Xe21+ and U28+ beams of up to 1.6 mA at 5 MeV/u. The effects of N2, and different rare gases in the pressure range from 4•10-7 mbar to 5•10-4 mbar have been investigated. The signal was read by different electronic cards, based on linear and logarithmic amplifiers as well as on charge integration. Furthermore the extraction voltage of the IPM-field-box was varied between 0.5 and 5 kV. Beam profiles were investigated with respect to signal intensity and profile shape and were compared to a SEM-grid and a Beam Induced Fluorescence monitor. Profiles of all monitors match nicely for the residual gases with differences in beam width well below 5%. Additional tests on the characteristics of the IPM have been performed and will be presented as well.
 
slides icon Slides WEOA03 [1.964 MB]