Author: Frisch, J.C.
Paper Title Page
MOOC02 Cavity BPM System for ATF2 23
 
  • A. Lyapin, R. Ainsworth, S.T. Boogert, G.E. Boorman, F.J. Cullinan, N.Y. Joshi
    JAI, Egham, Surrey, United Kingdom
  • A.S. Aryshev, Y. Honda, T. Tauchi, N. Terunuma, J. Urakawa
    KEK, Ibaraki, Japan
  • J.C. Frisch, D.J. McCormick, J. Nelson, T.J. Smith, G.R. White
    SLAC, Menlo Park, California, USA
  • A. Heo, E.-S. Kim, H.-S. Kim, Y.I. Kim
    KNU, Deagu, Republic of Korea
  • M.C. Ross
    Fermilab, Batavia, USA
 
  In this paper we summarise our 2-year experience operating the Cavity Beam Position Monitor (CBPM) system at the Accelerator Test Facility (ATF) in KEK. The system currently consists of 41 C and S-band CBPMs and is the main diagnostic tool for the new ATF2 extraction beamline. We concentrate on issues related to the scale of the system and also consider long-term effects, most of which are undetectable or insignificant in smaller experimental prototype systems. We consistently show sub-micron BPM resolutions and week-to-week scale drifts of an order of 1%.  
slides icon Slides MOOC02 [2.075 MB]  
 
TUPD38 Design of a Single-Shot Prism Spectrometer in the Near- and Mid-Infrared Wavelength Range for Ultra-Short Bunch Length Diagnostics 386
 
  • C. Behrens
    DESY, Hamburg, Germany
  • A.S. Fisher, J.C. Frisch, A. Gilevich, H. Loos, J. Loos
    SLAC, Menlo Park, California, USA
 
  The successful operation of high-gain free-electron lasers (FEL) relies on the understanding, manipulation, and control of the parameters of the driving electron bunch. Present and future FEL facilities have the tendency to push the parameters for even shorter bunches with lengths below 10 fs and charges well below 100 pC. This is also the order of magnitude at laser-driven plasma-based electron accelerators. Devices to diagnose such ultra-short bunches even need longitudinal resolutions smaller than the bunch lengths, i.e. in the range of a few femtoseconds. This resolution is currently out of reach with time-domain diagnostics like RF-based deflectors, and approaches in the frequency-domain have to be considered to overcome this limitation. Our approach is to extract the information on the longitudinal bunch profile by means of infrared spectroscopy using a prism as dispersive element. In this paper, we present the design considerations on a broadband single-shot spectrometer in the near- and mid-infrared wavelength range (0.8 - 39.0 μm).