DIPAC2011 - List of Authors (Becker, F.)

Paper

Title

Page

Scintillation Screen Investigations for High Energy Heavy Ion Beams at GSI

170

P. Forck, C.A. Andre, F. Becker, R. Haseitl, A. Reiter, B. Walasek-Höhne
GSI, Darmstadt, Germany
W. Ensinger, K. Renuka
TU Darmstadt, Darmstadt, Germany

Funding: Funded by the German Ministry of Science (BMBF) under contract No. 06DA9026
Various scintillation screens were irradiated with high energy ion beams as extracted from the GSI synchrotron SIS18. Their imaging properties were studied with the goal to achieve a precise transverse profile determination. Scintillation images were characterized with respect to the light yield and statistical moments of the light distribution i.e. imaged beam width and shape. To study the scintillation properties over a wide range of intensities a 300 MeV/u Uranium ion beam with 10⁴ to 10⁹ particles per pulse was applied. Sensitive scintillators, namely CsI:Tl, YAG:Ce, P43 and Ce-doped glass were investigated for lower beam currents. Ceramics like Al₂O₃, Al₂O₃:Cr, ZrO₂:Y and ZrO₂:Mg as well as Herasil-glass were studied up to the maximum beam currents. For the various screens remarkable differences have been observed, e.g. the recorded profile width varies by nearly a factor of two. The obtained results serve as a basis for an appropriate choice of scintillator materials, which have to cope with the diversity of ion species and intensities at FAIR.

Poster MOPD53 [1.897 MB]

MOPD60

Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool

185

C.A. Andre, F. Becker, H. Bräuning, P. Forck, R. Haseitl, R. Lonsing, B. Walasek-Höhne
GSI, Darmstadt, Germany

For high current operation at the GSI Heavy Ion UNILAC non intercepting methods for transverse beam profile determination are required. The Beam Induced Fluorescence (BIF) Monitor, an optical measurement device based on the observation of fluorescent light emitted by excited gas molecules was brought to routine operation. Detailed investigations were conducted for various beam parameters to improve the electronics and the optical setup. Up to now, four BIF monitor stations (for detection of both, horizontal and vertical beam profiles) were installed at UNILAC and two additional setups are planned. This contribution reports on first upgrades of the BIF monitors with a Siemens PLC for FESA-based slow controls and hardware protection procedures. The versatile control and display software ProfileView is presented as an easy-to-use and stable beam diagnostic tool for the GSI operating team.

Poster MOPD60 [3.060 MB]

WEOA03

Detailed Experimental Characterization of an Ionization Profile Monitor

547

J. Egberts, P. Abbon, F. Jeanneau, J.-Ph. Mols, T. Papaevangelou
CEA, Gif-sur-Yvette, France
F. Becker, P. Forck, B. Walasek-Höhne
GSI, Darmstadt, Germany
J. Marroncle
CEA/DSM/IRFU, France

Funding: Marie Curie Fellowship by the EU
In the frame of the International Fusion Material Irradiation Facility (IFMIF), a prototype for a non-interceptive transverse beam profile monitor based on residual gas ionization (IPM) has been built and characterized in detail. We present results of test measurements performed at CEA Saclay with 80 keV protons in a cw beam of up to 10 mA and at GSI Darmstadt with pulsed Ca¹⁰⁺, Xe²¹⁺ and U²⁸⁺ beams of up to 1.6 mA at 5 MeV/u. The effects of N₂, and different rare gases in the pressure range from 4•10^-7 mbar to 5•10^-4 mbar have been investigated. The signal was read by different electronic cards, based on linear and logarithmic amplifiers as well as on charge integration. Furthermore the extraction voltage of the IPM-field-box was varied between 0.5 and 5 kV. Beam profiles were investigated with respect to signal intensity and profile shape and were compared to a SEM-grid and a Beam Induced Fluorescence monitor. Profiles of all monitors match nicely for the residual gases with differences in beam width well below 5%. Additional tests on the characteristics of the IPM have been performed and will be presented as well.

Slides WEOA03 [1.964 MB]

WEOD01

Beam Induced Fluorescence Monitors

575

F. Becker
GSI, Darmstadt, Germany

Non-intercepting diagnostic devices in hadron accelerators offer continuous online monitoring capability. They also avoid the problem of potential thermal damage in high-current applications. Taking advantage of the residual gas as active material, the Beam Induced Fluorescence (BIF) monitor exploits gas fluorescence in the visible range for transversal profile measurements. Depending on beam parameters and vacuum-constraints, BIF monitors can be operated at base-pressure or in dedicated local pressure bumps up to the mbar range. Nowadays, BIF monitors are investigated in many accelerator laboratories for hadron energies from about 100 keV up to several 100 GeV. This talk gives an introduction to the measurement principle and typical operating conditions. It summarises recent investigations, e.g. on different working gases, and it compares various technical realisations.

Slides WEOD01 [12.701 MB]

Paper	Title	Page
MOPD53	Scintillation Screen Investigations for High Energy Heavy Ion Beams at GSI	170
	P. Forck, C.A. Andre, F. Becker, R. Haseitl, A. Reiter, B. Walasek-Höhne GSI, Darmstadt, Germany W. Ensinger, K. Renuka TU Darmstadt, Darmstadt, Germany
	Funding: Funded by the German Ministry of Science (BMBF) under contract No. 06DA9026 Various scintillation screens were irradiated with high energy ion beams as extracted from the GSI synchrotron SIS18. Their imaging properties were studied with the goal to achieve a precise transverse profile determination. Scintillation images were characterized with respect to the light yield and statistical moments of the light distribution i.e. imaged beam width and shape. To study the scintillation properties over a wide range of intensities a 300 MeV/u Uranium ion beam with 10⁴ to 10⁹ particles per pulse was applied. Sensitive scintillators, namely CsI:Tl, YAG:Ce, P43 and Ce-doped glass were investigated for lower beam currents. Ceramics like Al₂O₃, Al₂O₃:Cr, ZrO₂:Y and ZrO₂:Mg as well as Herasil-glass were studied up to the maximum beam currents. For the various screens remarkable differences have been observed, e.g. the recorded profile width varies by nearly a factor of two. The obtained results serve as a basis for an appropriate choice of scintillator materials, which have to cope with the diversity of ion species and intensities at FAIR.
	Poster MOPD53 [1.897 MB]

MOPD60	Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool	185
	C.A. Andre, F. Becker, H. Bräuning, P. Forck, R. Haseitl, R. Lonsing, B. Walasek-Höhne GSI, Darmstadt, Germany
	For high current operation at the GSI Heavy Ion UNILAC non intercepting methods for transverse beam profile determination are required. The Beam Induced Fluorescence (BIF) Monitor, an optical measurement device based on the observation of fluorescent light emitted by excited gas molecules was brought to routine operation. Detailed investigations were conducted for various beam parameters to improve the electronics and the optical setup. Up to now, four BIF monitor stations (for detection of both, horizontal and vertical beam profiles) were installed at UNILAC and two additional setups are planned. This contribution reports on first upgrades of the BIF monitors with a Siemens PLC for FESA-based slow controls and hardware protection procedures. The versatile control and display software ProfileView is presented as an easy-to-use and stable beam diagnostic tool for the GSI operating team.
	Poster MOPD60 [3.060 MB]

WEOA03	Detailed Experimental Characterization of an Ionization Profile Monitor	547
	J. Egberts, P. Abbon, F. Jeanneau, J.-Ph. Mols, T. Papaevangelou CEA, Gif-sur-Yvette, France F. Becker, P. Forck, B. Walasek-Höhne GSI, Darmstadt, Germany J. Marroncle CEA/DSM/IRFU, France
	Funding: Marie Curie Fellowship by the EU In the frame of the International Fusion Material Irradiation Facility (IFMIF), a prototype for a non-interceptive transverse beam profile monitor based on residual gas ionization (IPM) has been built and characterized in detail. We present results of test measurements performed at CEA Saclay with 80 keV protons in a cw beam of up to 10 mA and at GSI Darmstadt with pulsed Ca¹⁰⁺, Xe²¹⁺ and U²⁸⁺ beams of up to 1.6 mA at 5 MeV/u. The effects of N₂, and different rare gases in the pressure range from 4•10^-7 mbar to 5•10^-4 mbar have been investigated. The signal was read by different electronic cards, based on linear and logarithmic amplifiers as well as on charge integration. Furthermore the extraction voltage of the IPM-field-box was varied between 0.5 and 5 kV. Beam profiles were investigated with respect to signal intensity and profile shape and were compared to a SEM-grid and a Beam Induced Fluorescence monitor. Profiles of all monitors match nicely for the residual gases with differences in beam width well below 5%. Additional tests on the characteristics of the IPM have been performed and will be presented as well.
	Slides WEOA03 [1.964 MB]

WEOD01	Beam Induced Fluorescence Monitors	575
	F. Becker GSI, Darmstadt, Germany
	Non-intercepting diagnostic devices in hadron accelerators offer continuous online monitoring capability. They also avoid the problem of potential thermal damage in high-current applications. Taking advantage of the residual gas as active material, the Beam Induced Fluorescence (BIF) monitor exploits gas fluorescence in the visible range for transversal profile measurements. Depending on beam parameters and vacuum-constraints, BIF monitors can be operated at base-pressure or in dedicated local pressure bumps up to the mbar range. Nowadays, BIF monitors are investigated in many accelerator laboratories for hadron energies from about 100 keV up to several 100 GeV. This talk gives an introduction to the measurement principle and typical operating conditions. It summarises recent investigations, e.g. on different working gases, and it compares various technical realisations.
	Slides WEOD01 [12.701 MB]