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| THOALH02 | Development of the Non-invasive Beam-size Monitor using ODR | 256 |
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| The beam-size monitor based on Optical Diffraction Radiation (ODR) has been developed at the KEK-ATF. Because of its non-invasive nature, the ODR monitor might be one candidate to measure the extreme-low emittance electron beam for future LC?s and x-ray free electron lasers. To evaluate the beam-size, the angular distribution of the ODR emitted by the beam when crossing a slit in a metallic foil was measured. In the first trial, we observed interference patterns between ODR and backgrounds which may be the synchrotron radiation from most nearest bending magnet at the ATF extracted line. By the installation of the ceramic mask in front of our target, this interference was vanished. And comparing with the result of ODR measurements, we installed the wire scanner in the same position of our monitor. In this paper, we will present developments of the ODR monitor with some experimental results. | ||
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| THPKF036 | Developments of the FZP Beam Profile Monitor | 2350 |
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A beam profile monitor based on two Fresnel Zone Plates (FZPs) has been developed at the KEK-ATF damping ring. This monitor can perform real-time imaging of the electron beam with an X-ray imaging optics and the synchrotron radiation and measure the horizontal and vertical beam sizes with a high spatial resolution. A clear electron-beam image with the vertical beam size less than 10 microns was already obtained in the early measurements [*]. Thereafter some of the optical elements, the crystal monochromator, X-ray CCD camera and FZP holders, were improved and an X-ray pinhole mask was installed between the two FZPs for reducing the background of X-rays passing through the MZP (the second FZP). Aberrations due to alignment errors of the FZPs were studied with an analytical approach and a ray-tracing method and vibrations of the optical elements were measured in order to estimate their effects on the system performance. In this paper, we will present developments of the beam profile monitor with results of some beam-size measurements.
* K. Iida et al., Nucl. Instrum. Methods A506, p.41-49 (2003); N. Nakamura et al., Proc. of PAC2003, p.530-532 |
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| THPKF039 | Study of Photo-cathode RF Gun for a High Brightness Electron Beam | 2359 |
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| We are going to develop a compact high-brightness electron beam system to adopt industrial and medical applications. A multi-bunch photo-cathode RF gun has been developed to generate 100 bunches beam with 2.8ns spacing and 5nC charge per bunch. We will report details of the development, especially photo-cathode production and emission characteristics from cathode by the laser. | ||
| THPLT061 | Development of a Multibunch Photo-cathode RF Gun System | 2625 |
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| A multibunch photo-cathode RF gun system has been developed as a electron source for the production of quasi-monoenergetic X-rays based on inverse Compton scattering. This system consists of a photocathode rf gun, a cathode system, a laser system, beam diagnostic sections, and beam dump line. The gun produces 100 bunches with a 2.8ns bunch spacing and 5nC bunch charge. We will report on the RF gun system with 4 bending dipoles of a chicane which makes the laser injection to the cathode with perpendicular angle possible. | ||
| THPLT067 | Development of Optical Diffraction Radiation Beam Size Diagnostics at KEK Accelerator Test Facility | 2643 |
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| Extremely low emittance high current beam is required for the accelerators of the next generation such as linear collider to achieve a reasonable luminosity. However, up to now there is no a simple non-invasive technique for beam diagnostics. A method based on optical diffraction radiation (ODR) appearing when a charged particle passes through a slit between two semi-planes can be one of the promising approaches. The estimations show that it might be possible to measure the beam size as small as 10mcm for a single shot. For a test of the proposed technique we designed an experimental setup and installed it at the extraction line of the KEK-ATF (1.26GeV beam energy, 1010 e/bunch, rms beam size > 10mcm). The electron beam was moving through a 0.26mm wide slit. We have measured backward ODR angular distribution. We have observed the beam size effect on the measured quantities. The sensitivity to the beam size as small as 20mcm was achieved. However, some undesirable factors such as X-ray background, SR photons coming through the mask slit, big detector angular acceptance have to be reduced. In this case a few micrometers beam size could be measured. |