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Ackermann, W.

Paper Title Page
MOPKF027 Optimizing the PITZ Electron Source for the VUV-FEL 360
 
  • M. Krasilnikov, J. Bähr, U. Gensch, H.-J. Grabosch, J.H. Han, D. Lipka, V. Miltchev, A. Oppelt, B. Petrosyan, D. Pose, L. Staykov, F. Stephan
    DESY Zeuthen, Zeuthen
  • K. Abrahamyan
    YerPhI, Yerevan
  • W. Ackermann, R. Cee, W.F.O. Müller, S. Setzer, T. Weiland
    TEMF, Darmstadt
  • G. Asova, G. Dimitrov, I. Tsakov
    INRNE, Sofia
  • I. Bohnet, J.-P. Carneiro, K. Floettmann, S. Riemann, S. Schreiber
    DESY, Hamburg
  • M.V. Hartrott, E. Jaeschke, D. Krämer, R. Richter
    BESSY GmbH, Berlin
  • P. Michelato, L. Monaco, C. Pagani, D. Sertore
    INFN/LASA, Segrate (MI)
  • J. Rossbach
    Uni HH, Hamburg
  • W. Sandner, I. Will
    MBI, Berlin
 
  The goal of the Photo Injector Test Facility at DESY Zeuthen (PITZ) is to test and optimize electron sources for Free Electron Lasers and future linear colliders. At the end of 2003 the first stage of PITZ (PITZ1) has been successfully completed, resulting in the installation of the PITZ RF gun at the Vacuum Ultra Violet - Free Electron Laser (VUV-FEL) at DESY Hamburg. The main results achieved during the PITZ1 extensive measurement program are discussed in this paper. A minimum normalized beam emittance of about 1.5 pi mm mrad for 1 nC electron bunch charge has been reached by optimizing numerous photo injector parameters, e.g. longitudinal and transverse profiles of the photocathode laser, RF phase, main and bucking solenoid current. The second stage of PITZ (PITZ2), being a large extension of the facility and its research program, has started now. Recent progress on the PITZ2 developments will be reported as well.  
WEPLT061 Influence of Beam Tube Obstacles on the Emittance of the PITZ Photoinjector 1981
 
  • S. Setzer, W. Ackermann, S. Schnepp, T. Weiland
    TEMF, Darmstadt
 
  For detailed analysis of space charge dominated beams inside an RF Photoinjector PIC-Codes like MAFIA TS2/3 can be used. While the interaction of particles with the sourrounding geometries are taken into account, the applicability of such codes is restricted due to simulation time and memory consumption as well as by numercial noise. Therefore only smaller sections of the whole injector can be calculated. On the other hand codes like ASTRA can be used to simulate the whole injector but no interaction between bunch and geometry is included. To make use of the individual advantages of each code discribed above an interface for bidirectional bunch exchange between the two programs has been implemented. This approach allows for applying the right simulation method depending on the physical effects under investigation. To demonstrate the importance of such an approach the results of detailed numerical studies of the impact of beam tube obstacles like the laser mirror on the achievable emittance of the PITZ RF Photoinjector further downstream will be presented.  
THPLT034 Implementation of Higher Order Moments for Beam Dynamics Simulation with the V-Code 2550
 
  • W. Ackermann, T. Weiland
    TEMF, Darmstadt
 
  Based on the moment approach V-Code is implemented to simulate charged particle beam dynamics in linear accelerators. Its main aim is to perform elementary studies in those cases when the beam can be considered as a whole and thus making the motion of individual particles negligible in the overall view. Therefore an ensemble of particles can be well described by the moments of its phase-space distribution and the regarded order influences naturally the achievable accuracy as well as the computational effort. Since the well known moment equations generally are not closed, a technique to limit the number of involved moments has to be applied. So far all moments up to the second order have been considered whereas higher order moments are truncated. As a further step towards higher accuracy the influence of higher order moments has to be investigated. For this reason additional third-order equations are implemented into the V-Code and the achieved results are compared with previous second-order-based ones as well as with higher order approximations.