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RIS citation export for MOP083: R&D of Copper Electroplating Process for Power Couplers: Effect of Microstructures on RRR

TY  - CONF
AU  - Okii, Y.
AU  - Kako, E.
AU  - Michizono, S.
AU  - Taguchi, J.
AU  - Takahashi, H.
AU  - Yamamoto, Y.
AU  - Yasutake, H.
ED  - Michel, Peter
ED  - Arnold, André
ED  - Schaa, Volker RW
TI  - R&D of Copper Electroplating Process for Power Couplers: Effect of Microstructures on RRR
J2  - Proc. of SRF2019, Dresden, Germany, 30 June-05 July 2019
CY  - Dresden, Germany
T2  - International Conference on RF Superconductivity
T3  - 19
LA  - english
AB  - Power couplers for superconducting cavities are required to have both low-thermal conductivity and high-electrical conductivity, because high-thermal conductivity and low-electrical conductivity could generate unexpected increase for heat load. In order to combine these contrary properties, power couplers are made of stainless steel and plated with copper plating. As electrical conductivity of copper layer affects dynamic heat load, it is crucial to optimize plating processes. In this study, we investigated influences of plating parameters (i.e., thickness of copper layer, plating bath composition, bath temperature, heat-treatment conditions) on RRR by collaborative work among Nomura plating, CETD, and KEK. As a result, we obtained high-RRR samples with conditions noted below; (1) electroformed copper plate, (2) copper layer thickness of over 50 µm, and (3) heat-treatment at 200deg-1h, (4) other plating bath composition. In addition, we observed microstructures of several samples, then found that microstructures of copper layer are strongly related to RRR. In this paper, we will present the recent results for this investigation.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 278
EP  - 281
KW  - SRF
KW  - experiment
KW  - target
KW  - electron
KW  - ECR
DA  - 2019/08
PY  - 2019
SN  - ""
SN  - 978-3-95450-211-0
DO  - doi:10.18429/JACoW-SRF2019-MOP083
UR  - http://jacow.org/srf2019/papers/mop083.pdf
ER  -