<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Palmieri, V.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             The Way of Thick Films toward a Flat Q-curve in Sputtered Cavities
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-191-5</isbn>
		 <electronic-resource-num>10.18429/JACoW-SRF2017-TUYBA03</electronic-resource-num>
		 <language>English</language>
		 <pages>378-381</pages>
       <pages>TUYBA03</pages>
       <keywords>
          <keyword>ion</keyword>
          <keyword>cavity</keyword>
          <keyword>niobium</keyword>
          <keyword>interface</keyword>
          <keyword>site</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2018</year>
          <pub-dates>
             <date>2018-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-SRF2017-TUYBA03</url>
              <url>http://jacow.org/srf2017/papers/tuyba03.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Thick films have bulk like properties. In this paper it is explored the possibility to sputter 70 micron thick films in order to get rid of the Q-slope in Niobium sputtered Cop-per Cavities. An innovative method based on the multi-layer deposition of zero-stress single layers is reported. The deposition of zero-stress thick films into 6 GHz Cop-per seamless cavities, has shown the possibility to obtain straight curves for the Q-factor versus accelerating fields
       </abstract>
    </record>
  </records>
</xml>
