Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities

Vaglio, Ruggero; Palmieri, Vincenzo

doi:10.18429/JACoW-SRF2017-TUYBA02

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BiBTeX citation export for TUYBA02: Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities

@InProceedings{Vaglio:SRF2017-TUYBA02,
  author       = {R. Vaglio and V. Palmieri},
  title        = {{T}hermal {B}oundary {R}esistance {M}odel and {D}efect {S}tatistical {D}istribution in {N}b/{C}u {C}avities},
  booktitle    = {Proc. of International Conference on RF Superconductivity (SRF'17),
                  Lanzhou, China, July 17-21, 2017},
  pages        = {374--377},
  paper        = {TUYBA02},
  language     = {english},
  keywords     = {ion, cavity, interface, ISOL, feedback},
  venue        = {Lanzhou, China},
  series       = {International Conference on RF Superconductivity},
  number       = {18},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {Jan.},
  year         = {2018},
  isbn         = {978-3-95450-191-5},
  doi          = {https://doi.org/10.18429/JACoW-SRF2017-TUYBA02},
  url          = {http://jacow.org/srf2017/papers/tuyba02.pdf},
  note         = {https://doi.org/10.18429/JACoW-SRF2017-TUYBA02},
}