<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Vogel, M.</author>
             <author>Jiang, X.</author>
             <author>Schlemper, C.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Carbon-based Coatings for Electron Cloud Mitigation in SRF Photocathodes
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-191-5</isbn>
		 <electronic-resource-num>10.18429/JACoW-SRF2017-THPB076</electronic-resource-num>
		 <language>English</language>
		 <pages>910-913</pages>
       <pages>THPB076</pages>
       <keywords>
          <keyword>ion</keyword>
          <keyword>SRF</keyword>
          <keyword>gun</keyword>
          <keyword>cathode</keyword>
          <keyword>electron</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2018</year>
          <pub-dates>
             <date>2018-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-SRF2017-THPB076</url>
              <url>http://jacow.org/srf2017/papers/thpb076.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          During the past three years, we developed a coating along with a corresponding in-situ characterization process in order to realize SRF-gun surfaces featuring low secondary electron yield (SEY). Important aspects that have been accounted for are the homogeneity and adhesion of the coatings deposited on the cylindrical SRF-gun mantle. Furthermore, the correlation between SEY and crystallinity, morphology, and contamination was studied in detail. The SEY maximum can be tuned between 1.5 and less than 0.7 depending on the deposition conditions. In this work, we recap the results and present a general strategy for the effective mitigation of electron cloud multiplication.
       </abstract>
    </record>
  </records>
</xml>
