Iwashita, Y. Hayano, H. Hino, M. Kubo, T. Oikawa, H. Saeki, T. Tongu, H. JACoW Geneva, Switzerland 978-3-95450-191-5 10.18429/JACoW-SRF2017-THPB058 English 877-880 THPB058 ion cryogenics controls embedded FPGA Contribution to a conference proceedings 2018 2018-01 https://doi.org/10.18429/JACoW-SRF2017-THPB058 http://jacow.org/srf2017/papers/thpb058.pdf Multilayer thin film coating is a promising technology to enhance performance of superconducting cavities. Until recently, principal parameters to achieve the sufficient performance had not been known, such as the thickness of each layer. We proposed a method to deduce a set of the parameters to exhibit a good performances. In order to verify the scheme, we are trying to make some experiments on the subject at Kyoto. The sample preparation and the test setup for the measurement apparatus will be discussed.