Tuggle, J. Kelley, M.J. Palczewski, A.D. Pudasaini, U. Reece, C.E. Stevie, F.A. JACoW Geneva, Switzerland 978-3-95450-191-5 10.18429/JACoW-SRF2017-THPB036 English 821-824 THPB036 ion niobium cavity interface instrumentation Contribution to a conference proceedings 2018 2018-01 https://doi.org/10.18429/JACoW-SRF2017-THPB036 http://jacow.org/srf2017/papers/thpb036.pdf In order to fully understand nitrogen addition techniques it is vital to have a full understanding of the material, including the content, location, and speciation of nitrogen contained in the treated Nb. In this work Secondary Ion Mass Spectrometry (SIMS) is used to elucidate content and location. Dynamic SIMS nitrogen analysis is reported, for the first time, for "as-received" cavity grade niobium from three separate suppliers. In addition, a number of method and instrumental issues are discussed including depth resolution, detection limit, and quantification.