RUPAC2012 - List of Authors (Li, J.)

Paper

Title

Page

Beam Instability Phenomena Observed at HIRFL-CSR in the Presence of Electron Cooler

33

X.D. Yang, G.H. Li, J. Li, P. Li, X.M. Ma, R.S. Mao, T.L. Yan, J.C. Yang, Y.J. Yuan, T.C. Zhao
IMP, Lanzhou, People's Republic of China
L.J. Mao
FZJ, Jülich, Germany

Funding: Work supported by The National Natural Science Foundation of China, NSFC(Grant No. 10975166, 10905083)
The 35kV and 300kV electron coolers of HIRFL-CSR have come into routine operation. Some signal samples acquired from BPM and Schottky probes during operation were presented in this paper, and they were observed in the different operation periods such as during injection, after cooling and cooling force measurement. These signals were considered related with the ion beam instability. The central frequency of ion beam varied with the time. Some were caused by the ripple of hardware, the other were created by ion beam itself. The reasons which caused these phenomena were analysed. The possible solutions were suggested, and some necessary upgrade and improvements were expected. These results were helpful to attempt the Schottky Mass Spectrometry measurement in the CSR.

Slides MOZCH01 [5.663 MB]

Paper	Title	Page
MOZCH01	Beam Instability Phenomena Observed at HIRFL-CSR in the Presence of Electron Cooler	33
	X.D. Yang, G.H. Li, J. Li, P. Li, X.M. Ma, R.S. Mao, T.L. Yan, J.C. Yang, Y.J. Yuan, T.C. Zhao IMP, Lanzhou, People's Republic of China L.J. Mao FZJ, Jülich, Germany
	Funding: Work supported by The National Natural Science Foundation of China, NSFC(Grant No. 10975166, 10905083) The 35kV and 300kV electron coolers of HIRFL-CSR have come into routine operation. Some signal samples acquired from BPM and Schottky probes during operation were presented in this paper, and they were observed in the different operation periods such as during injection, after cooling and cooling force measurement. These signals were considered related with the ion beam instability. The central frequency of ion beam varied with the time. Some were caused by the ripple of hardware, the other were created by ion beam itself. The reasons which caused these phenomena were analysed. The possible solutions were suggested, and some necessary upgrade and improvements were expected. These results were helpful to attempt the Schottky Mass Spectrometry measurement in the CSR.
	Slides MOZCH01 [5.663 MB]