RuPAC 2006 - List of Authors

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Taratin, A.M.

Paper	Title	Page
THDO03	Method of Crystal Deflector Monitoring A.S.Gogolev, A.P.Potylitsyn Tomsk Polytechnic University, Tomsk, Russia A.M.Taratin JINR Russia The accelerated beams extraction is one of the important problems of modern facilities, such as J-PARC or Tevatron. One of an efficient approach is the beam extraction with using bent crystal deflectors. The on-line control of the quality of crystal structure of deflector becomes necessary, when crystal deflector is used to extraction of intense proton or ion beams. For example, intensity of proton beam at accelerator J-PARC is ~ 3*10¹⁴ per spill. Investigation the possible radiation damage of usually used silicon deflectors is the open question for such beams. In this work, the monitoring of crystal deflectors quality based on registration of parametric x-ray radiation (PXR) is proposed. Proposed method gives a possibility to control a uniformity of deflector bending by measuring a PRX line width and allows to estimate a damage of deflector crystal structure under intense beam.	43

Paper

Title

Page

THDO03

Method of Crystal Deflector Monitoring

A.S.Gogolev, A.P.Potylitsyn
Tomsk Polytechnic University, Tomsk, Russia

A.M.Taratin
JINR Russia

The accelerated beams extraction is one of the important problems of modern facilities, such as J-PARC or Tevatron. One of an efficient approach is the beam extraction with using bent crystal deflectors. The on-line control of the quality of crystal structure of deflector becomes necessary, when crystal deflector is used to extraction of intense proton or ion beams. For example, intensity of proton beam at accelerator J-PARC is ~ 3*10¹⁴ per spill. Investigation the possible radiation damage of usually used silicon deflectors is the open question for such beams. In this work, the monitoring of crystal deflectors quality based on registration of parametric x-ray radiation (PXR) is proposed. Proposed method gives a possibility to control a uniformity of deflector bending by measuring a PRX line width and allows to estimate a damage of deflector crystal structure under intense beam.