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RIS citation export for THP06: Reliability Improvement for the Insertion Device Control in the TPS

TY  - CONF
AU  - Wu, C.Y.
AU  - Chen, J.
AU  - Cheng, Y.-S.
AU  - Hsu, K.T.
AU  - Hu, K.H.
AU  - Liao, C.Y.
ED  - Cheng, Yung-Sen
ED  - Schaa, Volker RW
ED  - Chiu, Pei-Chen
ED  - Li, Lu
ED  - Liu, Yung-Hui
ED  - Petit-Jean-Genaz, Christine
TI  - Reliability Improvement for the Insertion Device Control in the TPS
J2  - Proc. of PCaPAC2018, Hsinchu, Taiwan, 16-19 October 2018
CY  - Hsinchu, Taiwan
T2  - International Workshop on Emerging Technologies and Scientific Facilities Controls
T3  - 12
LA  - english
AB  - Insertion devices (ID) are essential components in third-generation synchrotron light sources, which can produce highly-brilliant, collimated and quasi-monochromatic radiation over a broad energy range for experiments. Reliable operation of the insertion devices is important to users of beamlines. The most unpredictable fault is due to a soft error in optical absolute encoders due to radiation. There are several solutions to avoid such faults, e.g. by increasing the distance of the encoder from the beam, by a lead shield cover and finally by adopting an auxiliary position sensing devices to help recovery from a fault. Efforts to improve operational reliability of the TPS ID controls will be discussed.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 173
EP  - 175
KW  - controls
KW  - EPICS
KW  - insertion
KW  - radiation
KW  - insertion-device
DA  - 2019/01
PY  - 2019
SN  - 978-3-95450-200-4
DO  - DOI: 10.18429/JACoW-PCaPAC2018-THP06
UR  - http://jacow.org/pcapac2018/papers/thp06.pdf
ER  -