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WECOMA02 Fast Orbit Correction at the Canadian Light Source controls, power-supply, storage-ring, wiggler 9
 
  • C. G. Payne
    CLS, Saskatoon, Saskatchewan
  • D. Chabot
    BNL, Upton, Long Island, New York
  Correction of the electron beam orbit in the storage ring at the Canadian Light Source has historically been implemented using a correction system capable of only moderate update rates. Over the past several years work has been undertaken to reduce orbit perturbations and improve end user synchrotron beam quality by reimplementing the correction system and enabling orbit corrections several orders of magnitude faster. This paper will describe the implementation and migration of the orbit control software from the slow correction system to the fast system.  
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THPL014 The ANKA B-Field Test Facility Control System, based on a SPEC Macro Package Enhanced Setup power-supply, controls, insertion-device, undulator 156
 
  • K. Cerff, W. Mexner, T. Spangenberg
    Karlsruhe Institute of Technology (KIT), Karlsruhe
  The ANKA B-field test facility provides users with a flexible tool to investigate magnetic field distributions of different setups of coils or permanent magnets, optimal sensor types, geometrical arrangement and the possibility to change the independent physical stimuli to generate and alter magnetic field distributions. It is taken as an example of a straightforward device implementation with a recently introduced type of macro based ‘building block system’ for devices in spec. This macro package provides the C-like spec with an object orientated framework, with a namespace and class concept to represent the power supplies of different brands, probe positioning devices and measurement amplifiers. The device properties are stored as elements of an associative spec array, together with a set of standardized commands to access them. Their degree can be assumed to be volatile, private or public. The device properties can be initialized by default or synchronized with the values of the represented physical devices.  
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