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TUODAB02 | Electron Cloud Generation and Trapping in a Quadrupole Magnet at the LANL PSR | 828 |
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Funding: Work supported by DOE SBIR Grant No. DE-FG02-04ER84105 and CRADA No. LA05C10535 between TechSource, Inc. and the Los Alamos National Laboratory. Recent beam physics studies on the two-stream e-p instability at LANL proton storage ring (PSR) have focused on the role of the electron cloud generated in quadrupole magnets where electrons, which seed beam-induced multipacting, are expected to be largest due to grazing angle losses from the beam halo. A new diagnostic to measure electron cloud formation and trapping in a quadrupole magnet has been developed, installed, and successfully tested at PSR. Experimental results will be presented on various characteristics of electron cloud obtain from experiments using this diagnostic and compared with simulations. Results include data on flux and energy spectra of electrons striking the vacuum chamber, the line density and lifetime of electrons trapped in the quadrupole after the beam has been extracted as well as evidence regarding electrons ejected from the magnet during passage of the proton beam. |
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FRPMS054 | PSR Electron Cloud Detector and Suppressor Mechanical Design and Fabrication | 4117 |
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Funding: Work supported by DOE SBIR Grant No. DE-FG02-04ER84105 and CRADA No. LA05C10535 between TechSource, Inc. and the Los Alamos National Laboratory. In order to better understand the two stream e-p instability issue in the LANSCE Proton Storage Ring, a new diagnostic instrument has been developed to measure the electron cloud formation and trapping in a quadrupole magnet at the LANSCE, PSR. The device called the Electron Cloud Detector (ECD) was fabricated and has successfully been installed in the PSR. Along with the Electron Cloud Detector, an additional device was developed to manipulate electrons ejected from the quadrupole and allow additional information to be obtained from ECD measurements. This paper will discuss the mechanical design and fabrication issues encountered during the course of developing both devices. |