A   B   C   D   E   F   G   H   I   J   K   L   M   N   O   P   Q   R   S   T   U   V   W   X   Y   Z    

Byrne, W.E.

Paper Title Page
MPPE074 Commissioning of a Locally Isochronous Lattice at ALS 3922
 
  • W. Wan, W.E. Byrne, H. Nishimura, G.J. Portmann, D. Robin, F. Sannibale, A. Zholents
    LBNL, Berkeley, California
  
  Funding: Work supported by the Director, Office of Energy Research, Office of Basic Energy Science, Material Sciences Division, U.S. Department of Energy, under Contract No. DE-AC03-76SF00098.

With the advance of ultrafast science, manipulating electron beam at the sub-micron and nanometer scale has been actively pursued. A special lattice of the ALS storage ring was conceived to studythe sub-micron longitudinal structure of the beam. It contains sections that are isochronous to the firstorder. Due to the practical constraints of the accelerator, sextupoles have to be off and the dispersion at the injection point is 60 cm, which make commissioning a highly nontrivial task. After a few months of tuning, we have been able to store at 30 mA of beam at the life time of 2 hours. After a brief introduction to the motivation of the experiment and the design of the lattice, the process and more detailed results of the commissioning will be presented. Future plan will also be discussed.

 
RPAE060 Simulation and Automation of the EEBI Test at ALS 3485
 
  • H. Nishimura, W.E. Byrne
    LBNL, Berkeley, California
  
  Funding: Work supported by the U.S. Department of Energy under Contract No. DE-AC03-76SF00098.

The Errant Electron Beam Interlock (EEBI) is a system that protects the vacuum chamber of the Advanced Light Source (ALS) from synchrotron light damage should the orbit, through a superconducting bend magnet (superbend), become distorted. The EEBI system monitors the vertical beam position on two BPMs, one upstream and the other downstream, of the superbend and dumps the stored beam if the orbit exceeds preset limits in either offset or angle. Discussed are the modeling studies carried out to determine how to create a large vertical bump, both for performing the test and implementing the automated test software.