NAPAC2016 - List of Authors (Yang, B.X.)

Paper	Title	Page
WEPOB21	Benchmarking of Touschek Beam Lifetime Calculations for the Advanced Photon Source	940
	A. Xiao, B.X. Yang ANL, Argonne, Illinois, USA
	Funding: Work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. Particle loss from Touschek scattering is one of the most significant issues faced by present and future synchrotron light source storage rings. For example, the predicted, Touschek-dominated beam lifetime for the Advanced Photon Source (APS) Upgrade lattice in 48-bunch, 200-mA timing mode is only ~2 h. In order to understand the reliability of the predicted lifetime, a series of measurements with various beam parameters was performed on the present APS storage ring. This paper first describes the entire process of beam lifetime measurement, then compares measured lifetime with the calculated one by applying the measured beam parameters. The results show very good agreement.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2016-WEPOB21
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FRA1IO02	State of the Art X-Ray Photon BPMs for Next Generation Storage Ring Light Sources
	B.X. Yang ANL, Argonne, Illinois, USA R. Ischebeck PSI, Villigen PSI, Switzerland
	From http://journals.aps.org/prab/pdf/10.1103/PhysRevSTAB.18.082802: "A transverse profile imager for ultrabright electron beams is presented, which overcomes resolution issues in present designs by observing the Scheimpflug imaging condition as well as the Snell- Descartes law of refraction in the scintillating crystal. Coherent optical transition radiation emitted by highly compressed electron bunches on the surface of the crystal is directed away from the camera, allowing to use the monitor for profile measurements of electron bunches suitable for X-ray free electron lasers…" The detector design and it's integration for routine use with a transverse mode deflecting cavity will be reviewed with experimental data from the SwissFEL Injector Test Facility.
	Slides FRA1IO02 [4.095 MB]
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Paper

Title

Page

Benchmarking of Touschek Beam Lifetime Calculations for the Advanced Photon Source

940

A. Xiao, B.X. Yang
ANL, Argonne, Illinois, USA

Funding: Work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
Particle loss from Touschek scattering is one of the most significant issues faced by present and future synchrotron light source storage rings. For example, the predicted, Touschek-dominated beam lifetime for the Advanced Photon Source (APS) Upgrade lattice in 48-bunch, 200-mA timing mode is only ~2 h. In order to understand the reliability of the predicted lifetime, a series of measurements with various beam parameters was performed on the present APS storage ring. This paper first describes the entire process of beam lifetime measurement, then compares measured lifetime with the calculated one by applying the measured beam parameters. The results show very good agreement.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2016-WEPOB21

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

FRA1IO02

State of the Art X-Ray Photon BPMs for Next Generation Storage Ring Light Sources

B.X. Yang
ANL, Argonne, Illinois, USA
R. Ischebeck
PSI, Villigen PSI, Switzerland

From http://journals.aps.org/prab/pdf/10.1103/PhysRevSTAB.18.082802: "A transverse profile imager for ultrabright electron beams is presented, which overcomes resolution issues in present designs by observing the Scheimpflug imaging condition as well as the Snell- Descartes law of refraction in the scintillating crystal. Coherent optical transition radiation emitted by highly compressed electron bunches on the surface of the crystal is directed away from the camera, allowing to use the monitor for profile measurements of electron bunches suitable for X-ray free electron lasers…" The detector design and it's integration for routine use with a transverse mode deflecting cavity will be reviewed with experimental data from the SwissFEL Injector Test Facility.

Slides FRA1IO02 [4.095 MB]

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)